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Currently, the computer aided design models have been used for projection simulation. Compared with the stereolithographic model, the Unigraphics NX (UG) model can describe complex objects with multiple materials. However, calculating the intersection of a ray with a UG model can only be performed by an internal function, which greatly decreases the efficiency of the projection simulation. Therefore, we propose a fast method for projection simulation based on multi\u2010core. In this method, we use the internal function to calculate the intersection points and the corresponding face normal vectors for a ray. By computing the dot product between the direction vector of the ray and the face normal vectors, we can determine the entry and exit point pairs, and further obtain the simulation projection. On this basis, the projection simulation tasks are evenly decomposed to multiple processes. Then, we invoke these processes by multi\u2010thread in a main process, and realize parallel implementation of the projection simulation. Numerical experiments demonstrate the accuracy and effectiveness of the method, and we can obtain nearly linear speedup of the multi\u2010core acceleration.<\/jats:p>","DOI":"10.1002\/cpe.6846","type":"journal-article","created":{"date-parts":[[2022,1,20]],"date-time":"2022-01-20T05:24:45Z","timestamp":1642656285000},"update-policy":"https:\/\/2.zoppoz.workers.dev:443\/https\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Multi\u2010core accelerated simulation of x\u2010ray projection based on Unigraphics NX model"],"prefix":"10.1002","volume":"34","author":[{"ORCID":"https:\/\/2.zoppoz.workers.dev:443\/https\/orcid.org\/0000-0003-4180-1341","authenticated-orcid":false,"given":"Shunli","family":"Zhang","sequence":"first","affiliation":[{"name":"School of Information Science and Technology Northwest University  Xi'an China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shang","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology Northwest University  Xi'an China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuanzhen","family":"Liu","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Electronics University of Liverpool  Liverpool UK"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuhe","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology Northwest University  Xi'an China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/2.zoppoz.workers.dev:443\/https\/orcid.org\/0000-0001-8688-1387","authenticated-orcid":false,"given":"Haibo","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology Northwest University  Xi'an China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","published-online":{"date-parts":[[2022,1,19]]},"reference":[{"key":"e_1_2_7_2_1","doi-asserted-by":"publisher","DOI":"10.1007\/s10921-020-00721-1"},{"key":"e_1_2_7_3_1","doi-asserted-by":"publisher","DOI":"10.1007\/s00068-018-1000-1"},{"key":"e_1_2_7_4_1","doi-asserted-by":"publisher","DOI":"10.1097\/RLI.0000000000000601"},{"key":"e_1_2_7_5_1","doi-asserted-by":"publisher","DOI":"10.3390\/s19092167"},{"key":"e_1_2_7_6_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.compscitech.2017.10.023"},{"key":"e_1_2_7_7_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.forsciint.2019.109963"},{"key":"e_1_2_7_8_1","doi-asserted-by":"publisher","DOI":"10.1186\/s40494-020-00366-3"},{"key":"e_1_2_7_9_1","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-018-33685-4"},{"key":"e_1_2_7_10_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.culher.2021.03.004"},{"key":"e_1_2_7_11_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.culher.2019.02.001"},{"key":"e_1_2_7_12_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.patrec.2014.03.023"},{"key":"e_1_2_7_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1974.6499235"},{"key":"e_1_2_7_14_1","doi-asserted-by":"publisher","DOI":"10.1088\/0031-9155\/57\/13\/N237"},{"key":"e_1_2_7_15_1","doi-asserted-by":"publisher","DOI":"10.1118\/1.2955743"},{"key":"e_1_2_7_16_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.sab.2004.03.016"},{"key":"e_1_2_7_17_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.cpc.2007.11.008"},{"key":"e_1_2_7_18_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0168-583X(00)00185-3"},{"key":"e_1_2_7_19_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2012.05.030"},{"key":"e_1_2_7_20_1","doi-asserted-by":"crossref","unstructured":"PresentiA SijbersJ DekkerAJ BeenhouwerJ.CAD\u2010based defect inspection with optimal view angle selection based on polychromatic x\u2010ray projection images. 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