{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,31]],"date-time":"2025-12-31T12:06:45Z","timestamp":1767182805638,"version":"3.28.2"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,8,28]],"date-time":"2024-08-28T00:00:00Z","timestamp":1724803200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/2.zoppoz.workers.dev:443\/https\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,8,28]],"date-time":"2024-08-28T00:00:00Z","timestamp":1724803200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/2.zoppoz.workers.dev:443\/https\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,8,28]]},"DOI":"10.1109\/case59546.2024.10711424","type":"proceedings-article","created":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T17:40:16Z","timestamp":1729705216000},"page":"3201-3206","source":"Crossref","is-referenced-by-count":1,"title":["Open-Set Fault Diagnosis based on Prototype Learning with Dual Category-Classifier"],"prefix":"10.1109","author":[{"given":"Shenqiang","family":"Ke","sequence":"first","affiliation":[{"name":"Huazhong University of Science and Technology,State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering,Wuhan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Liang","family":"Gao","sequence":"additional","affiliation":[{"name":"Huazhong University of Science and Technology,State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering,Wuhan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xinyu","family":"Li","sequence":"additional","affiliation":[{"name":"Huazhong University of Science and Technology,State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering,Wuhan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yiping","family":"Gao","sequence":"additional","affiliation":[{"name":"Huazhong University of Science and Technology,State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering,Wuhan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2022.3177662"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2021.3056867"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.psep.2022.08.014"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tpami.2012.256"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2018.04.006"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2018.2826477"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2021.106925"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2022.3149935"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3054651"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3070324"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2022.108358"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-46478-7_31"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CSSE.2008.621"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICPR.1998.711145"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2021.3106743"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2020.3045079"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2019.8852312"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.173"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00414"}],"event":{"name":"2024 IEEE 20th International Conference on Automation Science and Engineering (CASE)","start":{"date-parts":[[2024,8,28]]},"location":"Bari, Italy","end":{"date-parts":[[2024,9,1]]}},"container-title":["2024 IEEE 20th International Conference on Automation Science and Engineering (CASE)"],"original-title":[],"link":[{"URL":"https:\/\/2.zoppoz.workers.dev:443\/http\/xplorestaging.ieee.org\/ielx8\/10711304\/10711288\/10711424.pdf?arnumber=10711424","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T01:46:33Z","timestamp":1732671993000},"score":1,"resource":{"primary":{"URL":"https:\/\/2.zoppoz.workers.dev:443\/https\/ieeexplore.ieee.org\/document\/10711424\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,8,28]]},"references-count":20,"URL":"https:\/\/2.zoppoz.workers.dev:443\/https\/doi.org\/10.1109\/case59546.2024.10711424","relation":{},"subject":[],"published":{"date-parts":[[2024,8,28]]}}}