{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T20:07:22Z","timestamp":1725566842091},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/dft.2008.29","type":"proceedings-article","created":{"date-parts":[[2008,10,14]],"date-time":"2008-10-14T20:03:33Z","timestamp":1224014613000},"page":"143-151","source":"Crossref","is-referenced-by-count":0,"title":["On Optimizing Fault Coverage, Pattern Count, and ATPG Run Time Using a Hybrid Single-Capture Scheme for Testing Scan Designs"],"prefix":"10.1109","author":[{"family":"Shianling Wu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Laung-Terng Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Zhigang Jiang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Jiayong Song","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Boryau Sheu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Xiaoqing Wen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.S.","family":"Hsiao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.C.-M.","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Jiun-Lang Huang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"Apte","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"VLSI Test Principles and Architectures Design for Testability","year":"2006","key":"3"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511816321"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437648"},{"journal-title":"Essentials of Electronic Testing For Digital Memory & Mixed-Signal VLSI Circuits","year":"2000","author":"bushnell","key":"1"},{"journal-title":"ATPG User's Manuals - TurboScan? and VirtualScan?","year":"2008","key":"7"},{"article-title":"multiple-capture dft system for detecting or locating crossing clock-domain faults during scan-test","year":"2007","author":"wang","key":"6"},{"key":"5","article-title":"cutting soc test costs with the right kind of scan","author":"apte","year":"2002","journal-title":"EDAVision Magazine"},{"journal-title":"System-on-Chip Test Architectures Nanometer Design for Testability","year":"2007","key":"4"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1145\/775832.776000"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041755"},{"article-title":"smart capture for atpg (automatic test pattern generation) and fault simulation of scan-based integrated circuits","year":"2006","author":"wang","key":"11"},{"article-title":"method for performing atpg and fault simulation in a scan-based integrated circuit","year":"2007","author":"abdel-hafez","key":"12"}],"event":{"name":"2008 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","start":{"date-parts":[[2008,10,1]]},"location":"Cambridge, MA, USA","end":{"date-parts":[[2008,10,3]]}},"container-title":["2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems"],"original-title":[],"link":[{"URL":"https:\/\/2.zoppoz.workers.dev:443\/http\/xplorestaging.ieee.org\/ielx5\/4641141\/4641142\/04641167.pdf?arnumber=4641167","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,3,19]],"date-time":"2021-03-19T21:01:20Z","timestamp":1616187680000},"score":1,"resource":{"primary":{"URL":"https:\/\/2.zoppoz.workers.dev:443\/https\/ieeexplore.ieee.org\/document\/4641167\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":12,"URL":"https:\/\/2.zoppoz.workers.dev:443\/https\/doi.org\/10.1109\/dft.2008.29","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}