{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T20:26:41Z","timestamp":1725481601760},"reference-count":17,"publisher":"IEEE Comput. Soc. Press","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.1989.82316","type":"proceedings-article","created":{"date-parts":[[2003,1,13]],"date-time":"2003-01-13T18:46:33Z","timestamp":1042483593000},"page":"327-336","source":"Crossref","is-referenced-by-count":5,"title":["Design of a BIST RAM with row\/column pattern sensitive fault detection capability"],"prefix":"10.1109","author":[{"given":"M.","family":"Franklin","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.K.","family":"Saluja","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Kinoshita","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/356914.356916"},{"key":"ref11","first-page":"159","article-title":"A Self-testing Dynamic RAM Chip","author":"you","year":"1984","journal-title":"Proc Conf Advanced Research in VLSI"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1989.105540"},{"journal-title":"An Algorithm for the Detection of Row\/Column Pattern Sensitive Faults in RAMs","year":"1989","author":"franklin","key":"ref13"},{"key":"ref14","first-page":"248","article-title":"Two Dimensional Multiple Access Testing Technique of RAM","author":"malek","year":"1986","journal-title":"Proc ICCD"},{"key":"ref15","first-page":"306","article-title":"A Novel Fault-Tolerant Design of Testable Dynamic Random Access Memory","author":"mazumder","year":"1987","journal-title":"Proc ICCD"},{"key":"ref16","first-page":"830","article-title":"A Built-In Self-Testing Design of Random Access Memory (BISTRAM)","author":"le","year":"1986","journal-title":"Proc International Test Conference"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1987.1052797"},{"key":"ref4","first-page":"81","article-title":"Testing of Semiconductor Random Access Memories","author":"thatte","year":"1977","journal-title":"Proc FTCS-7"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1977.1674761"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1979.1675331"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1978.1675150"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675601"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1975.224182"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1976.10246"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-95424-5"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1985.1676572"}],"event":{"name":"Proceedings. 'Meeting the Tests of Time'., International Test Conference","location":"Washington, DC, USA"},"container-title":["Proceedings. 'Meeting the Tests of Time'., International Test Conference"],"original-title":[],"link":[{"URL":"https:\/\/2.zoppoz.workers.dev:443\/http\/xplorestaging.ieee.org\/ielx2\/834\/2698\/00082316.pdf?arnumber=82316","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,9]],"date-time":"2017-03-09T08:16:29Z","timestamp":1489047389000},"score":1,"resource":{"primary":{"URL":"https:\/\/2.zoppoz.workers.dev:443\/http\/ieeexplore.ieee.org\/document\/82316\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":17,"URL":"https:\/\/2.zoppoz.workers.dev:443\/https\/doi.org\/10.1109\/test.1989.82316","relation":{},"subject":[]}}