{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,9]],"date-time":"2026-02-09T05:43:57Z","timestamp":1770615837497,"version":"3.49.0"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T00:00:00Z","timestamp":1675209600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/2.zoppoz.workers.dev:443\/https\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T00:00:00Z","timestamp":1675209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/2.zoppoz.workers.dev:443\/https\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T00:00:00Z","timestamp":1675209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/2.zoppoz.workers.dev:443\/https\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Program of China","award":["2020YFB1806606"],"award-info":[{"award-number":["2020YFB1806606"]}]},{"DOI":"10.13039\/501100012247","name":"Program of Shanghai Academic Research Leader","doi-asserted-by":"publisher","award":["21XD1433700"],"award-info":[{"award-number":["21XD1433700"]}],"id":[{"id":"10.13039\/501100012247","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100013105","name":"Shanghai Rising-Star Program","doi-asserted-by":"publisher","award":["21QC1400800"],"award-info":[{"award-number":["21QC1400800"]}],"id":[{"id":"10.13039\/501100013105","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Young Elite Scientists Sponsorship Program by CIC","award":["2021QNRC001"],"award-info":[{"award-number":["2021QNRC001"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Veh. Technol."],"published-print":{"date-parts":[[2023,2]]},"DOI":"10.1109\/tvt.2022.3209866","type":"journal-article","created":{"date-parts":[[2022,9,26]],"date-time":"2022-09-26T20:42:40Z","timestamp":1664224960000},"page":"2632-2637","source":"Crossref","is-referenced-by-count":3,"title":["A Rotated-Constellation Based Method for BER Analysis in Uplink NOMA Systems"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/2.zoppoz.workers.dev:443\/https\/orcid.org\/0000-0001-8794-3156","authenticated-orcid":false,"given":"Yifeng","family":"Wang","sequence":"first","affiliation":[{"name":"School of Microelectronics, University of Chinese Academy of Sciences, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/2.zoppoz.workers.dev:443\/https\/orcid.org\/0000-0002-0420-0566","authenticated-orcid":false,"given":"Ting","family":"Zhou","sequence":"additional","affiliation":[{"name":"Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/2.zoppoz.workers.dev:443\/https\/orcid.org\/0000-0002-7152-1378","authenticated-orcid":false,"given":"Tianheng","family":"Xu","sequence":"additional","affiliation":[{"name":"Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/2.zoppoz.workers.dev:443\/https\/orcid.org\/0000-0002-4665-5278","authenticated-orcid":false,"given":"Honglin","family":"Hu","sequence":"additional","affiliation":[{"name":"Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/COMST.2016.2621116"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MCOM.2018.1800179"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/COMST.2018.2835558"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2018.2813524"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2017.2720583"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2020.3003274"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1049\/iet-com.2018.5278"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2020.2981024"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2942113"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/SIU.2018.8404743"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2019.2953109"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/LWC.2020.3015920"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MTTW51045.2020.9245043"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2021.3077609"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2021.3088526"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2019.2933253"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/LWC.2021.3103937"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/BlackSeaCom52164.2021.9527867"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2016.2622706"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/VTCSpring.2018.8417842"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2018.2881683"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2018.2867480"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TWC.2019.2919292"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2017.2781708"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511841224"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1063\/1.3034123"}],"container-title":["IEEE Transactions on Vehicular Technology"],"original-title":[],"link":[{"URL":"https:\/\/2.zoppoz.workers.dev:443\/http\/xplorestaging.ieee.org\/ielx7\/25\/10043591\/09903630.pdf?arnumber=9903630","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T22:33:09Z","timestamp":1705962789000},"score":1,"resource":{"primary":{"URL":"https:\/\/2.zoppoz.workers.dev:443\/https\/ieeexplore.ieee.org\/document\/9903630\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,2]]},"references-count":26,"journal-issue":{"issue":"2"},"URL":"https:\/\/2.zoppoz.workers.dev:443\/https\/doi.org\/10.1109\/tvt.2022.3209866","relation":{},"ISSN":["0018-9545","1939-9359"],"issn-type":[{"value":"0018-9545","type":"print"},{"value":"1939-9359","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,2]]}}}