{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,18]],"date-time":"2025-11-18T12:16:40Z","timestamp":1763468200402},"publisher-location":"New Jersey","reference-count":0,"publisher":"IEEE Conference Publications","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014]]},"DOI":"10.7873\/date.2014.186","type":"proceedings-article","created":{"date-parts":[[2014,4,30]],"date-time":"2014-04-30T03:56:54Z","timestamp":1398830214000},"page":"1-6","source":"Crossref","is-referenced-by-count":7,"title":["Exploiting expendable process-margins in DRAMs for run-time performance optimization"],"prefix":"10.7873","author":[{"given":"Karthik","family":"Chandrasekar","sequence":"first","affiliation":[]},{"given":"Sven","family":"Goossens","sequence":"additional","affiliation":[]},{"given":"Christian","family":"Weis","sequence":"additional","affiliation":[]},{"given":"Martijn","family":"Koedam","sequence":"additional","affiliation":[]},{"given":"Benny","family":"Akesson","sequence":"additional","affiliation":[]},{"given":"Norbert","family":"Wehn","sequence":"additional","affiliation":[]},{"given":"Kees","family":"Goossens","sequence":"additional","affiliation":[]}],"member":"4628","event":{"number":"17","sponsor":["EDAA","CEDA","EDA Consortium","ACM SIGDA","RAS","ECSI"],"acronym":"DATE14","name":"Design Automation and Test in Europe","start":{"date-parts":[[2014,3,24]]},"theme":"Design, automation, and test","location":"Dresden, Germany","end":{"date-parts":[[2014,3,28]]}},"container-title":["Design, Automation &amp; Test in Europe Conference &amp; Exhibition (DATE), 2014"],"original-title":[],"deposited":{"date-parts":[[2014,4,30]],"date-time":"2014-04-30T04:00:06Z","timestamp":1398830406000},"score":1,"resource":{"primary":{"URL":"https:\/\/2.zoppoz.workers.dev:443\/http\/ieeexplore.ieee.org\/xpl\/articleDetails.jsp?arnumber=6800387"}},"subtitle":[],"proceedings-subject":"Electronic systems design and test","short-title":[],"issued":{"date-parts":[[2014]]},"references-count":0,"URL":"https:\/\/2.zoppoz.workers.dev:443\/https\/doi.org\/10.7873\/date.2014.186","relation":{},"subject":[],"published":{"date-parts":[[2014]]}}}