{"id":"https://openalex.org/W3022135467","doi":"https://doi.org/10.1016/j.diin.2004.04.004","title":"The need for objective case review","display_name":"The need for objective case review","publication_year":2004,"publication_date":"2004-05-29","ids":{"openalex":"https://openalex.org/W3022135467","doi":"https://doi.org/10.1016/j.diin.2004.04.004","mag":"3022135467"},"language":"en","primary_location":{"id":"doi:10.1016/j.diin.2004.04.004","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.diin.2004.04.004","pdf_url":null,"source":{"id":"https://openalex.org/S67081940","display_name":"Digital Investigation","issn_l":"1742-2876","issn":["1742-2876","1873-202X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Digital Investigation","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013979006","display_name":"Eoghan Casey","orcid":"https://orcid.org/0000-0001-7219-317X"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Eoghan Casey","raw_affiliation_strings":["Knowledge Solutions LLC, Baltimore MD, United States","Stroz Friedberg LLC, Washington DC, United States"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Knowledge Solutions LLC, Baltimore MD, United States","institution_ids":[]},{"raw_affiliation_string":"Stroz Friedberg LLC, Washington DC, United States","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":["https://openalex.org/A5013979006"],"corresponding_institution_ids":[],"apc_list":{"value":2750,"currency":"USD","value_usd":2750},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.75487808,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"1","issue":"2","first_page":"83","last_page":"85"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9652000069618225,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9652000069618225,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7902371883392334},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.743365466594696},{"id":"https://openalex.org/keywords/jaccard-index","display_name":"Jaccard index","score":0.582876443862915},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5601946115493774},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5519475936889648},{"id":"https://openalex.org/keywords/preprocessor","display_name":"Preprocessor","score":0.5345548391342163},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.49531951546669006},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4812331199645996},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4581649899482727},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.4489877223968506},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08862540125846863},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.07054629921913147}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7902371883392334},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.743365466594696},{"id":"https://openalex.org/C203519979","wikidata":"https://www.wikidata.org/wiki/Q865360","display_name":"Jaccard index","level":3,"score":0.582876443862915},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5601946115493774},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5519475936889648},{"id":"https://openalex.org/C34736171","wikidata":"https://www.wikidata.org/wiki/Q918333","display_name":"Preprocessor","level":2,"score":0.5345548391342163},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.49531951546669006},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4812331199645996},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4581649899482727},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4489877223968506},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08862540125846863},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.07054629921913147},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.diin.2004.04.004","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.diin.2004.04.004","pdf_url":null,"source":{"id":"https://openalex.org/S67081940","display_name":"Digital Investigation","issn_l":"1742-2876","issn":["1742-2876","1873-202X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Digital Investigation","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.5400000214576721,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2026456060"],"related_works":["https://openalex.org/W4254879869","https://openalex.org/W3022576529","https://openalex.org/W2628526247","https://openalex.org/W2596401011","https://openalex.org/W2913569734","https://openalex.org/W3127229356","https://openalex.org/W2000801317","https://openalex.org/W2095030957","https://openalex.org/W2066827917","https://openalex.org/W2884201223"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-23T08:03:31.855105","created_date":"2025-10-10T00:00:00"}