{"id":"https://openalex.org/W2895768653","doi":"https://doi.org/10.1109/access.2018.2873808","title":"Establishing of a 1000 V Multi-Decade Inductive Voltage Divider Standard at NIM","display_name":"Establishing of a 1000 V Multi-Decade Inductive Voltage Divider Standard at NIM","publication_year":2018,"publication_date":"2018-01-01","ids":{"openalex":"https://openalex.org/W2895768653","doi":"https://doi.org/10.1109/access.2018.2873808","mag":"2895768653"},"language":"en","primary_location":{"id":"doi:10.1109/access.2018.2873808","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2873808","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2018.2873808","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100717295","display_name":"Wei Wang","orcid":"https://orcid.org/0000-0002-6082-0639"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Wang","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-6082-0639","affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067956081","display_name":"Yan Yang","orcid":"https://orcid.org/0000-0003-3097-2620"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yan Yang","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103284766","display_name":"Lu Huang","orcid":"https://orcid.org/0000-0002-8206-159X"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lu Huang","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100332426","display_name":"Zhonghua Zhang","orcid":"https://orcid.org/0009-0003-6825-0196"},"institutions":[{"id":"https://openalex.org/I4210162136","display_name":"National Institute of Metrology","ror":"https://ror.org/05dw0p167","country_code":"CN","type":"other","lineage":["https://openalex.org/I4210162136"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhonghua Zhang","raw_affiliation_strings":["National Institute of Metrology, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Institute of Metrology, Beijing, China","institution_ids":["https://openalex.org/I4210162136"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210162136"],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.09848048,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"6","issue":null,"first_page":"58594","last_page":"58599"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9908000230789185,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9908000230789185,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9854999780654907,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9593999981880188,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-divider","display_name":"Voltage divider","score":0.5441717505455017},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4866431653499603},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.47831252217292786},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3547624349594116},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3212873935699463},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3200317621231079},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1888323724269867}],"concepts":[{"id":"https://openalex.org/C49324399","wikidata":"https://www.wikidata.org/wiki/Q466758","display_name":"Voltage divider","level":3,"score":0.5441717505455017},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4866431653499603},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.47831252217292786},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3547624349594116},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3212873935699463},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3200317621231079},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1888323724269867}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2018.2873808","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2873808","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:9ad89d79a92941de83623fdefa90701d","is_oa":true,"landing_page_url":"https://doaj.org/article/9ad89d79a92941de83623fdefa90701d","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 6, Pp 58594-58599 (2018)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2018.2873808","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2018.2873808","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.75,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G2901308236","display_name":null,"funder_award_id":"51377150","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320331086","display_name":"National Institute of Metrology, China","ror":"https://ror.org/05dw0p167"},{"id":"https://openalex.org/F4320334904","display_name":"National Institute for Materials Science","ror":"https://ror.org/026v1ze26"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1977354173","https://openalex.org/W1987056123","https://openalex.org/W2027672898","https://openalex.org/W2060205174","https://openalex.org/W2117933502","https://openalex.org/W2139039549","https://openalex.org/W2182154577","https://openalex.org/W2518253972","https://openalex.org/W6726447828"],"related_works":["https://openalex.org/W2108760005","https://openalex.org/W1980924287","https://openalex.org/W2349104731","https://openalex.org/W3085932616","https://openalex.org/W2985839233","https://openalex.org/W2006444598","https://openalex.org/W2062376469","https://openalex.org/W4240696014","https://openalex.org/W2028058072","https://openalex.org/W2490288450"],"abstract_inverted_index":{"A":[0,82],"multi-decade":[1,18,156],"1000-V":[2,24],"inductive":[3],"voltage":[4,25],"divider":[5],"(IVD)":[6],"was":[7],"established":[8],"at":[9,28,91,137],"the":[10,23,29,55,99,110,117,135,155,165],"National":[11],"Institute":[12],"of":[13,134,164],"Metrology":[14],"in":[15,32,95],"China.":[16],"This":[17],"IVD":[19,157],"will":[20],"function":[21],"as":[22],"ratio":[26,42,119],"standard":[27],"power":[30],"frequency":[31],"a":[33,39,143],"traceability":[34],"system.":[35],"It":[36],"can":[37],"provide":[38],"wide":[40],"output":[41,118],"ranging":[43],"from":[44],"<inline-formula":[45,59,170],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[46,60,171],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[47,61,172],"<tex-math":[48,62,173],"notation=\"LaTeX\">$1\\times":[49],"10^{-8}$":[50],"</tex-math></inline-formula>":[51,65,176],"to":[52,77,97,115,153],"1":[53],"with":[54,85,126,147],"accuracy":[56],"better":[57],"than":[58,169],"notation=\"LaTeX\">$0.05~\\mu":[63],"\\text{V}$":[64,175],"/V":[66],"(in-phase":[67],"and":[68,142],"quadrature).":[69],"Two":[70],"different":[71],"winding":[72],"connection":[73],"methods":[74],"are":[75],"used":[76,90,152],"achieve":[78],"their":[79],"respective":[80],"effects.":[81],"special":[83],"structure":[84],"four":[86],"independent":[87],"shieldings":[88],"is":[89,107,113,140,151,167],"first":[92],"two":[93],"windings":[94],"order":[96],"reduce":[98],"IVD\u2019s":[100],"burden.":[101],"An":[102,121],"error":[103],"compensation":[104],"method,":[105],"which":[106],"based":[108],"on":[109,131],"transformer":[111,146],"injection,":[112],"introduced":[114],"improve":[116],"accuracy.":[120],"improved":[122],"bootstrap":[123],"calibration":[124],"method":[125],"fully":[127],"equal":[128],"potential":[129,139],"guards":[130],"all":[132],"parts":[133],"circuits":[136],"nonzero":[138],"presented,":[141],"multi-ratio":[144],"reference":[145],"symmetric":[148],"leakage":[149],"design":[150],"calibrate":[154],"for":[158],"combinational":[159],"usage.":[160],"The":[161],"expanded":[162],"uncertainty":[163],"self-calibration":[166],"less":[168],"notation=\"LaTeX\">$0.02~\\mu":[174],"/V.":[177]},"counts_by_year":[],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}