{"id":"https://openalex.org/W4391582483","doi":"https://doi.org/10.1109/access.2024.3363184","title":"Refined Analytical EM Model of IC-Internal Shielding for Hardware-Security and Intra-Device Simulative Framework","display_name":"Refined Analytical EM Model of IC-Internal Shielding for Hardware-Security and Intra-Device Simulative Framework","publication_year":2024,"publication_date":"2024-01-01","ids":{"openalex":"https://openalex.org/W4391582483","doi":"https://doi.org/10.1109/access.2024.3363184"},"language":"en","primary_location":{"id":"doi:10.1109/access.2024.3363184","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3363184","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10423642.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10423642.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5093874310","display_name":"Edut Katz","orcid":"https://orcid.org/0009-0005-1212-6924"},"institutions":[{"id":"https://openalex.org/I13955877","display_name":"Bar-Ilan University","ror":"https://ror.org/03kgsv495","country_code":"IL","type":"education","lineage":["https://openalex.org/I13955877"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Edut Katz","raw_affiliation_strings":["Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel"],"raw_orcid":"https://orcid.org/0009-0005-1212-6924","affiliations":[{"raw_affiliation_string":"Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel","institution_ids":["https://openalex.org/I13955877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021526680","display_name":"Moshe Avital","orcid":"https://orcid.org/0000-0002-3812-8697"},"institutions":[{"id":"https://openalex.org/I16362100","display_name":"Rafael Advanced Defense Systems (Israel)","ror":"https://ror.org/016mey390","country_code":"IL","type":"company","lineage":["https://openalex.org/I16362100"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Moshe Avital","raw_affiliation_strings":["Rafael Defense Systems Inc., Haifa, Israel"],"raw_orcid":"https://orcid.org/0000-0002-3812-8697","affiliations":[{"raw_affiliation_string":"Rafael Defense Systems Inc., Haifa, Israel","institution_ids":["https://openalex.org/I16362100"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032341525","display_name":"Itamar Levi","orcid":"https://orcid.org/0000-0002-5591-5799"},"institutions":[{"id":"https://openalex.org/I13955877","display_name":"Bar-Ilan University","ror":"https://ror.org/03kgsv495","country_code":"IL","type":"education","lineage":["https://openalex.org/I13955877"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Itamar Levi","raw_affiliation_strings":["Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel"],"raw_orcid":"https://orcid.org/0000-0002-5591-5799","affiliations":[{"raw_affiliation_string":"Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel","institution_ids":["https://openalex.org/I13955877"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":1850,"currency":"USD","value_usd":1850},"apc_paid":{"value":1850,"currency":"USD","value_usd":1850},"fwci":0.7901,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.65346403,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"12","issue":null,"first_page":"22205","last_page":"22218"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10951","display_name":"Cryptographic Implementations and Security","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromagnetic-shielding","display_name":"Electromagnetic shielding","score":0.8390323519706726},{"id":"https://openalex.org/keywords/information-leakage","display_name":"Information leakage","score":0.7052885293960571},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6473073959350586},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.6108924150466919},{"id":"https://openalex.org/keywords/shields","display_name":"Shields","score":0.5603297352790833},{"id":"https://openalex.org/keywords/exploit","display_name":"Exploit","score":0.5186028480529785},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.32099881768226624},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.2825916111469269},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2569623589515686},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14788028597831726}],"concepts":[{"id":"https://openalex.org/C2265751","wikidata":"https://www.wikidata.org/wiki/Q332007","display_name":"Electromagnetic shielding","level":2,"score":0.8390323519706726},{"id":"https://openalex.org/C2779201187","wikidata":"https://www.wikidata.org/wiki/Q2775060","display_name":"Information leakage","level":2,"score":0.7052885293960571},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6473073959350586},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.6108924150466919},{"id":"https://openalex.org/C109589588","wikidata":"https://www.wikidata.org/wiki/Q2253638","display_name":"Shields","level":3,"score":0.5603297352790833},{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.5186028480529785},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.32099881768226624},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.2825916111469269},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2569623589515686},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14788028597831726},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/access.2024.3363184","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3363184","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10423642.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:8ea48b296c984b2da7f395771bd3bf7c","is_oa":true,"landing_page_url":"https://doaj.org/article/8ea48b296c984b2da7f395771bd3bf7c","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 12, Pp 22205-22218 (2024)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2024.3363184","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2024.3363184","pdf_url":"https://ieeexplore.ieee.org/ielx7/6287639/6514899/10423642.pdf","source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1775067294","display_name":null,"funder_award_id":"ID377","funder_id":"https://openalex.org/F4320325704","funder_display_name":"PAZY Foundation"}],"funders":[{"id":"https://openalex.org/F4320325704","display_name":"PAZY Foundation","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4391582483.pdf","grobid_xml":"https://content.openalex.org/works/W4391582483.grobid-xml"},"referenced_works_count":16,"referenced_works":["https://openalex.org/W108606907","https://openalex.org/W1526510856","https://openalex.org/W1608011328","https://openalex.org/W2084841055","https://openalex.org/W2123904602","https://openalex.org/W2142547609","https://openalex.org/W2898452627","https://openalex.org/W2970952103","https://openalex.org/W2987478323","https://openalex.org/W2999189851","https://openalex.org/W3015744303","https://openalex.org/W3123315151","https://openalex.org/W3158891310","https://openalex.org/W4251742697","https://openalex.org/W4285004590","https://openalex.org/W4293794120"],"related_works":["https://openalex.org/W2135006564","https://openalex.org/W2510929412","https://openalex.org/W1989776122","https://openalex.org/W2090600372","https://openalex.org/W2167360886","https://openalex.org/W2563712089","https://openalex.org/W2158503671","https://openalex.org/W2793737051","https://openalex.org/W3097433287","https://openalex.org/W2050431783"],"abstract_inverted_index":{"Over":[0],"the":[1,5,23,49,65,74,86,100,103,122,133,138,149,154,166,242],"past":[2],"two":[3],"decades,":[4],"prominence":[6],"of":[7,27,51,67,76,82,88,105,124,136,140,168,172,190,196,204,244],"physical":[8,25],"attacks":[9,21],"on":[10,165],"electronic":[11],"devices,":[12],"designed":[13],"to":[14,32,42,129,153,226],"extract":[15],"confidential":[16],"information,":[17],"has":[18,59,117],"surged.":[19],"These":[20],"exploit":[22],"inherent":[24],"characteristics":[26],"integrated":[28],"circuits":[29],"(ICs),":[30],"leading":[31],"information":[33,115],"leakage.":[34],"While":[35],"several":[36],"cutting-edge":[37],"countermeasures":[38],"have":[39,162],"been":[40,61,118],"developed":[41],"thwart":[43],"attempts":[44],"at":[45],"obtaining":[46],"sensitive":[47],"data,":[48],"potential":[50],"<italic":[52],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[53],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">shielding</i>":[54],"as":[55],"a":[56,141,180,202,212,235],"defensive":[57],"mechanism":[58],"not":[60],"comprehensively":[62],"explored":[63],"within":[64,230],"realm":[66],"ICs.":[68,125],"Shielding,":[69],"with":[70],"its":[71],"capabilities":[72],"encompassing":[73],"reduction":[75],"electromagnetic":[77],"(EM)":[78],"radiation":[79,110],"leakage,":[80],"detection":[81],"penetration":[83,171],"attempts,":[84],"and":[85,112,148,198,223,238],"obfuscation":[87],"adversaries\u2019":[89],"measurement":[90],"efforts,":[91],"presents":[92],"an":[93],"intriguing":[94],"avenue":[95],"for":[96,145,186],"safeguarding":[97],"information.":[98],"Remarkably,":[99],"investigation":[101],"into":[102],"efficacy":[104],"shielding":[106,173,228],"in":[107,121,194],"minimizing":[108],"EM":[109],"leakage":[111,116,146],"consequently":[113],"curtailing":[114],"somewhat":[119],"limited":[120],"context":[123],"This":[126],"limitation":[127],"extends":[128],"various":[130],"aspects,":[131],"including":[132],"topological":[134],"configuration":[135],"shields,":[137],"development":[139],"comprehensive":[142],"analytical":[143,183],"model":[144,184],"assessment,":[147],"simulation":[150,213],"capacity":[151],"prior":[152],"silicon":[155],"fabrication":[156],"stage.":[157],"Previous":[158],"state-of-the-art":[159],"(SOTA)":[160],"reports":[161],"primarily":[163],"concentrated":[164],"prevention":[167],"probing":[169],"or":[170],"mechanisms.":[174],"In":[175],"our":[176],"research,":[177],"we":[178,210],"contribute":[179],"fully":[181],"refined":[182],"tailored":[185],"IC":[187,205,218,239],"shielding,":[188],"capable":[189],"accurately":[191],"estimating":[192],"fields":[193],"presence":[195],"shields":[197],"evaluating":[199],"security":[200],"against":[201],"spectrum":[203],"hardware":[206],"(HW)":[207],"attacks.":[208],"Importantly,":[209],"introduce":[211],"methodology":[214],"employing":[215],"CAD":[216,237],"tools,":[217],"Process":[219],"Design":[220],"Kit":[221],"(PDK),":[222],"Ansys":[224],"HFSS":[225],"evaluate":[227],"performance":[229],"layouts":[231],"directly":[232],"imported":[233],"from":[234],"commercial":[236],"PDKs,":[240],"following":[241],"integration":[243],"full-chip":[245],"tools.":[246]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}