{"id":"https://openalex.org/W4406857595","doi":"https://doi.org/10.1109/access.2025.3535103","title":"A Novel Approach to Test-Induced Defect Detection in Semiconductor Wafers, Using Graph-Based Semi-Supervised Learning (GSSL)","display_name":"A Novel Approach to Test-Induced Defect Detection in Semiconductor Wafers, Using Graph-Based Semi-Supervised Learning (GSSL)","publication_year":2025,"publication_date":"2025-01-01","ids":{"openalex":"https://openalex.org/W4406857595","doi":"https://doi.org/10.1109/access.2025.3535103"},"language":"en","primary_location":{"id":"doi:10.1109/access.2025.3535103","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3535103","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.1109/access.2025.3535103","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5116046114","display_name":"Pedram Tabatabaeemoshiri","orcid":null},"institutions":[{"id":"https://openalex.org/I33849332","display_name":"University of Malaya","ror":"https://ror.org/00rzspn62","country_code":"MY","type":"education","lineage":["https://openalex.org/I33849332"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Pedram Tabatabaeemoshiri","raw_affiliation_strings":["Department of Electrical Engineering, Faculty of Engineering, University of Malaya, Kuala Lumpur, Malaysia"],"raw_orcid":"https://orcid.org/0000-0001-8239-1823","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Faculty of Engineering, University of Malaya, Kuala Lumpur, Malaysia","institution_ids":["https://openalex.org/I33849332"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032680537","display_name":"Narendra Kumar Aridas","orcid":"https://orcid.org/0000-0001-9999-8971"},"institutions":[{"id":"https://openalex.org/I33849332","display_name":"University of Malaya","ror":"https://ror.org/00rzspn62","country_code":"MY","type":"education","lineage":["https://openalex.org/I33849332"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Narendra Kumar","raw_affiliation_strings":["Department of Electrical Engineering, Faculty of Engineering, University of Malaya, Kuala Lumpur, Malaysia"],"raw_orcid":"https://orcid.org/0000-0001-9999-8971","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Faculty of Engineering, University of Malaya, Kuala Lumpur, Malaysia","institution_ids":["https://openalex.org/I33849332"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065170715","display_name":"Anis Salwa Mohd Khairuddin","orcid":"https://orcid.org/0000-0002-9873-4779"},"institutions":[{"id":"https://openalex.org/I33849332","display_name":"University of Malaya","ror":"https://ror.org/00rzspn62","country_code":"MY","type":"education","lineage":["https://openalex.org/I33849332"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Anis Salwa Mohd Khairuddin","raw_affiliation_strings":["Department of Electrical Engineering, Faculty of Engineering, University of Malaya, Kuala Lumpur, Malaysia"],"raw_orcid":"https://orcid.org/0000-0002-9873-4779","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Faculty of Engineering, University of Malaya, Kuala Lumpur, Malaysia","institution_ids":["https://openalex.org/I33849332"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090993570","display_name":"Daniel Ting","orcid":null},"institutions":[{"id":"https://openalex.org/I4210093973","display_name":"National Stroke Association of Malaysia","ror":"https://ror.org/00pqehw64","country_code":"MY","type":"nonprofit","lineage":["https://openalex.org/I4210093973"]},{"id":"https://openalex.org/I4210147344","display_name":"Malaysia University of Science and Technology","ror":"https://ror.org/04frcff47","country_code":"MY","type":"education","lineage":["https://openalex.org/I4210147344"]},{"id":"https://openalex.org/I4210156111","display_name":"Selangor Business School","ror":"https://ror.org/042wb3s35","country_code":"MY","type":"education","lineage":["https://openalex.org/I4210156111"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Daniel Ting","raw_affiliation_strings":["NXP Malaysia, Petaling Jaya, Selangor, Malaysia","Industrial Zone Sungei Way, Petaling Jaya, NXP Malaysia, Selangor, Malaysia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Malaysia, Petaling Jaya, Selangor, Malaysia","institution_ids":["https://openalex.org/I4210093973","https://openalex.org/I4210147344","https://openalex.org/I4210156111"]},{"raw_affiliation_string":"Industrial Zone Sungei Way, Petaling Jaya, NXP Malaysia, Selangor, Malaysia","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5116046115","display_name":"Vivek Regeev","orcid":null},"institutions":[{"id":"https://openalex.org/I4210093973","display_name":"National Stroke Association of Malaysia","ror":"https://ror.org/00pqehw64","country_code":"MY","type":"nonprofit","lineage":["https://openalex.org/I4210093973"]},{"id":"https://openalex.org/I4210147344","display_name":"Malaysia University of Science and Technology","ror":"https://ror.org/04frcff47","country_code":"MY","type":"education","lineage":["https://openalex.org/I4210147344"]},{"id":"https://openalex.org/I4210156111","display_name":"Selangor Business School","ror":"https://ror.org/042wb3s35","country_code":"MY","type":"education","lineage":["https://openalex.org/I4210156111"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Vivek Regeev","raw_affiliation_strings":["NXP Malaysia, Petaling Jaya, Selangor, Malaysia","Industrial Zone Sungei Way, Petaling Jaya, NXP Malaysia, Selangor, Malaysia"],"raw_orcid":"https://orcid.org/0009-0008-6997-6622","affiliations":[{"raw_affiliation_string":"NXP Malaysia, Petaling Jaya, Selangor, Malaysia","institution_ids":["https://openalex.org/I4210093973","https://openalex.org/I4210147344","https://openalex.org/I4210156111"]},{"raw_affiliation_string":"Industrial Zone Sungei Way, Petaling Jaya, NXP Malaysia, Selangor, Malaysia","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2075,"currency":"USD","value_usd":2075},"apc_paid":{"value":2075,"currency":"USD","value_usd":2075},"fwci":1.4446,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.79309082,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":"13","issue":null,"first_page":"21678","last_page":"21694"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9754999876022339,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6320823431015015},{"id":"https://openalex.org/keywords/conductor","display_name":"Conductor","score":0.5779234170913696},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.5286486744880676},{"id":"https://openalex.org/keywords/graph","display_name":"Graph","score":0.5220960378646851},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4029967784881592},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.3593624234199524},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.2889624238014221},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.2742348313331604},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.1509038209915161}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6320823431015015},{"id":"https://openalex.org/C34800285","wikidata":"https://www.wikidata.org/wiki/Q5159395","display_name":"Conductor","level":2,"score":0.5779234170913696},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.5286486744880676},{"id":"https://openalex.org/C132525143","wikidata":"https://www.wikidata.org/wiki/Q141488","display_name":"Graph","level":2,"score":0.5220960378646851},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4029967784881592},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3593624234199524},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2889624238014221},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.2742348313331604},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.1509038209915161},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/access.2025.3535103","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3535103","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},{"id":"pmh:oai:eprints.um.edu.my:48043","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ACCESS.2025.3535103","pdf_url":null,"source":{"id":"https://openalex.org/S4306400330","display_name":"The University of Malaya Research Repository (University of Malaya)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I33849332","host_organization_name":"University of Malaya","host_organization_lineage":["https://openalex.org/I33849332"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"PeerReviewed"},{"id":"pmh:oai:doaj.org/article:5f1e5ac7e31f4fb49f59ef8dda39a032","is_oa":true,"landing_page_url":"https://doaj.org/article/5f1e5ac7e31f4fb49f59ef8dda39a032","pdf_url":null,"source":{"id":"https://openalex.org/S4306401280","display_name":"DOAJ (DOAJ: Directory of Open Access Journals)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-sa","license_id":"https://openalex.org/licenses/cc-by-sa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Access, Vol 13, Pp 21678-21694 (2025)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1109/access.2025.3535103","is_oa":true,"landing_page_url":"https://doi.org/10.1109/access.2025.3535103","pdf_url":null,"source":{"id":"https://openalex.org/S2485537415","display_name":"IEEE Access","issn_l":"2169-3536","issn":["2169-3536"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Access","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G620229953","display_name":null,"funder_award_id":"PPSI-2020-CLUSTER-IDIG07","funder_id":"https://openalex.org/F4320322604","funder_display_name":"Universiti Malaya"}],"funders":[{"id":"https://openalex.org/F4320322604","display_name":"Universiti Malaya","ror":"https://ror.org/00rzspn62"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1969198379","https://openalex.org/W2013927912","https://openalex.org/W2020286945","https://openalex.org/W2092243497","https://openalex.org/W2342857862","https://openalex.org/W2790607928","https://openalex.org/W2794908468","https://openalex.org/W2922187519","https://openalex.org/W2945987769","https://openalex.org/W2969866791","https://openalex.org/W2979289378","https://openalex.org/W2984353870","https://openalex.org/W3000664697","https://openalex.org/W3036154480","https://openalex.org/W3082906739","https://openalex.org/W3107338864","https://openalex.org/W3133744637","https://openalex.org/W3137061779","https://openalex.org/W3215461502","https://openalex.org/W4220899306","https://openalex.org/W4288071427","https://openalex.org/W4315782999","https://openalex.org/W4362734521","https://openalex.org/W4366003071","https://openalex.org/W4394829985","https://openalex.org/W6637131181","https://openalex.org/W6680434193","https://openalex.org/W6682494755","https://openalex.org/W6726873649"],"related_works":["https://openalex.org/W2961085424","https://openalex.org/W4306674287","https://openalex.org/W4387369504","https://openalex.org/W3046775127","https://openalex.org/W4394896187","https://openalex.org/W3170094116","https://openalex.org/W4386462264","https://openalex.org/W3107602296","https://openalex.org/W4364306694","https://openalex.org/W4312192474"],"abstract_inverted_index":{"The":[0,101],"semiconductor":[1,11,35,95,144],"industry":[2],"plays":[3],"a":[4,80,109,116,128,132,136],"vital":[5],"role":[6],"in":[7,14,107,143],"modern":[8],"technology,":[9],"with":[10],"devices":[12,21],"embedded":[13],"almost":[15],"all":[16],"electronic":[17],"products.":[18],"As":[19],"these":[20,89],"become":[22],"increasingly":[23],"complex,":[24],"ensuring":[25],"quality":[26,141],"and":[27,62,73,114],"reliability":[28],"poses":[29],"significant":[30,74],"challenges.":[31],"Electrical":[32],"testing":[33,44],"on":[34,56,93,131],"wafers":[36],"for":[37],"defects":[38,52,92],"is":[39],"crucial,":[40],"but":[41],"paradoxically,":[42],"the":[43,57,94],"process":[45],"itself":[46],"can":[47],"introduce":[48],"defects.":[49],"These":[50],"test-induced":[51,90],"could":[53],"remain":[54],"undetected":[55],"wafer,":[58,113],"proceed":[59],"through":[60],"assembly,":[61],"may":[63],"only":[64],"be":[65],"discovered":[66],"later":[67],"by":[68,126],"customers,":[69],"leading":[70],"to":[71,87,139],"returns":[72],"yield":[75],"loss.":[76],"This":[77],"study":[78],"proposes":[79],"novel":[81],"graph-based":[82],"semi-supervised":[83],"learning":[84],"(GSSL)":[85],"algorithm":[86],"identify":[88],"hidden":[91],"wafer":[96],"that":[97],"escape":[98],"conventional":[99],"methods.":[100],"algorithm,":[102],"which":[103],"incorporates":[104],"domain":[105],"knowledge":[106],"creating":[108],"graph":[110],"representation":[111],"of":[112],"utilizing":[115],"weighted":[117],"edge":[118],"label":[119],"propagation":[120],"model,":[121],"has":[122],"demonstrated":[123],"its":[124],"effectiveness":[125],"achieving":[127],"68%":[129],"accuracy":[130],"real-world":[133],"dataset,":[134],"offering":[135],"promising":[137],"approach":[138],"enhance":[140],"control":[142],"manufacturing.":[145]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4}],"updated_date":"2026-08-21T09:56:20.448147","created_date":"2025-01-28T00:00:00"}