{"id":"https://openalex.org/W2163777444","doi":"https://doi.org/10.1109/ats.2004.65","title":"On Test and Diagnostics of Flash Memories","display_name":"On Test and Diagnostics of Flash Memories","publication_year":2005,"publication_date":"2005-04-06","ids":{"openalex":"https://openalex.org/W2163777444","doi":"https://doi.org/10.1109/ats.2004.65","mag":"2163777444"},"language":"en","primary_location":{"id":"doi:10.1109/ats.2004.65","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats.2004.65","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"13th Asian Test Symposium","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029346217","display_name":"Chih-Tsun Huang","orcid":"https://orcid.org/0000-0002-0214-6826"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chih-Tsun Huang","raw_affiliation_strings":["Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111933987","display_name":"Jen-Chieh Yeh","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jen-Chieh Yeh","raw_affiliation_strings":["Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058769705","display_name":"Yuan-Yuan Shih","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yuan-Yuan Shih","raw_affiliation_strings":["Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051484648","display_name":"Rei-Fu Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Rei-Fu Huang","raw_affiliation_strings":["Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5075548524","display_name":"Cheng\u2010Wen Wu","orcid":"https://orcid.org/0000-0001-8614-7908"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Cheng-Wen Wu","raw_affiliation_strings":["Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I25846049"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"260","last_page":"265"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.7759004235267639},{"id":"https://openalex.org/keywords/flash-memory-emulator","display_name":"Flash memory emulator","score":0.7677019238471985},{"id":"https://openalex.org/keywords/flash-memory","display_name":"Flash memory","score":0.665023148059845},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6157597899436951},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5841039419174194},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.5765635967254639},{"id":"https://openalex.org/keywords/flash-file-system","display_name":"Flash file system","score":0.5725026726722717},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.5235342979431152},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.495051771402359},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.4670362174510956},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.46304231882095337},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.4501884877681732},{"id":"https://openalex.org/keywords/memory-test","display_name":"Memory test","score":0.43345749378204346},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3899341821670532},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2678399682044983},{"id":"https://openalex.org/keywords/computer-memory","display_name":"Computer memory","score":0.26284700632095337},{"id":"https://openalex.org/keywords/semiconductor-memory","display_name":"Semiconductor memory","score":0.22983673214912415}],"concepts":[{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.7759004235267639},{"id":"https://openalex.org/C96535780","wikidata":"https://www.wikidata.org/wiki/Q5457561","display_name":"Flash memory emulator","level":5,"score":0.7677019238471985},{"id":"https://openalex.org/C2776531357","wikidata":"https://www.wikidata.org/wiki/Q174077","display_name":"Flash memory","level":2,"score":0.665023148059845},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6157597899436951},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5841039419174194},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.5765635967254639},{"id":"https://openalex.org/C27670709","wikidata":"https://www.wikidata.org/wiki/Q5457555","display_name":"Flash file system","level":4,"score":0.5725026726722717},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.5235342979431152},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.495051771402359},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.4670362174510956},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.46304231882095337},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.4501884877681732},{"id":"https://openalex.org/C3017990537","wikidata":"https://www.wikidata.org/wiki/Q6815759","display_name":"Memory test","level":3,"score":0.43345749378204346},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3899341821670532},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2678399682044983},{"id":"https://openalex.org/C92855701","wikidata":"https://www.wikidata.org/wiki/Q5830907","display_name":"Computer memory","level":3,"score":0.26284700632095337},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.22983673214912415},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C169900460","wikidata":"https://www.wikidata.org/wiki/Q2200417","display_name":"Cognition","level":2,"score":0.0},{"id":"https://openalex.org/C169760540","wikidata":"https://www.wikidata.org/wiki/Q207011","display_name":"Neuroscience","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/ats.2004.65","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ats.2004.65","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"13th Asian Test Symposium","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.130.5701","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.130.5701","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://ieeexplore.ieee.org/iel5/9468/30045/01376568.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.5400000214576721,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1956019682","https://openalex.org/W2106246015","https://openalex.org/W2106935654","https://openalex.org/W2111985228","https://openalex.org/W2112727903","https://openalex.org/W2113358566","https://openalex.org/W2113399863","https://openalex.org/W2119927730","https://openalex.org/W2121842885","https://openalex.org/W2129179754","https://openalex.org/W2157571503","https://openalex.org/W2157879254","https://openalex.org/W2165615559","https://openalex.org/W6678258098","https://openalex.org/W6683403585"],"related_works":["https://openalex.org/W1937038249","https://openalex.org/W2082353818","https://openalex.org/W2291767606","https://openalex.org/W164278522","https://openalex.org/W2182056015","https://openalex.org/W2085734125","https://openalex.org/W1691732600","https://openalex.org/W2391055460","https://openalex.org/W2013745773","https://openalex.org/W1605301908"],"abstract_inverted_index":{"Embedded":[0],"flash":[1,20,48,84,98],"memory":[2,85],"has":[3],"been":[4],"widely":[5],"used":[6],"in":[7],"applications":[8],"that":[9,26],"require":[10],"non-volatile":[11],"on-chip":[12],"storage":[13],"elements.":[14],"However,":[15],"test":[16,44,61,105],"and":[17,41,45,62,75,92,106],"diagnostics":[18,46,107],"of":[19,30,47,59,103],"memories":[21],"needs":[22],"further":[23],"investigation":[24],"so":[25],"the":[27,31,39,60,101],"overall":[28],"cost":[29],"products":[32],"can":[33],"be":[34],"reduced.":[35],"This":[36],"paper":[37],"presents":[38],"challenges":[40],"issues":[42],"for":[43,89],"memories,":[49],"based":[50],"on":[51,96],"our":[52,104],"recent":[53],"experiences.":[54],"We":[55],"also":[56],"suggest":[57],"improvement":[58],"diagnosis":[63],"flow,":[64],"including":[65],"design-for-testability":[66],"(DFT)":[67],"using":[68,87],"built-in":[69,72],"self-test":[70],"(BIST),":[71],"self-repair":[73],"(BISR),":[74],"failure":[76],"analysis.":[77],"In":[78],"addition,":[79],"we":[80],"present":[81],"a":[82],"configurable":[83],"tester":[86],"FPGA":[88],"low-cost":[90],"testing":[91],"diagnostics.":[93],"Experimental":[94],"results":[95],"industrial":[97],"chips":[99],"justify":[100],"effectiveness":[102],"system.":[108]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}