{"id":"https://openalex.org/W2537561280","doi":"https://doi.org/10.1109/esscirc.2016.7598332","title":"Register file circuits and post-deployment framework to monitor aging effects in field","display_name":"Register file circuits and post-deployment framework to monitor aging effects in field","publication_year":2016,"publication_date":"2016-09-01","ids":{"openalex":"https://openalex.org/W2537561280","doi":"https://doi.org/10.1109/esscirc.2016.7598332","mag":"2537561280"},"language":"en","primary_location":{"id":"doi:10.1109/esscirc.2016.7598332","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2016.7598332","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC Conference 2016: 42nd European Solid-State Circuits Conference","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103094370","display_name":"Teng Yang","orcid":"https://orcid.org/0000-0002-9277-143X"},"institutions":[{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Teng Yang","raw_affiliation_strings":["Department of Electrical Engineering, Columbia University, New York, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Columbia University, New York, NY, USA","institution_ids":["https://openalex.org/I78577930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049341354","display_name":"Peter R. Kinget","orcid":"https://orcid.org/0000-0002-5707-6394"},"institutions":[{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Peter R. Kinget","raw_affiliation_strings":["Department of Electrical Engineering, Columbia University, New York, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Columbia University, New York, NY, USA","institution_ids":["https://openalex.org/I78577930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011887658","display_name":"Mingoo Seok","orcid":"https://orcid.org/0000-0002-9722-0979"},"institutions":[{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mingoo Seok","raw_affiliation_strings":["Department of Electrical Engineering, Columbia University, New York, NY, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Columbia University, New York, NY, USA","institution_ids":["https://openalex.org/I78577930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I78577930"],"apc_list":null,"apc_paid":null,"fwci":1.2109,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.74988568,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"425","last_page":"428"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pmos-logic","display_name":"PMOS logic","score":0.7132986187934875},{"id":"https://openalex.org/keywords/software-deployment","display_name":"Software deployment","score":0.6487184762954712},{"id":"https://openalex.org/keywords/nmos-logic","display_name":"NMOS logic","score":0.6445410847663879},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6036589741706848},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5465904474258423},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.534796416759491},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.5120909214019775},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.42584678530693054},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.41241276264190674},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.3733680844306946},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3469180464744568},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2946165204048157},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.27264276146888733},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2096017599105835},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.14665573835372925},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.12316030263900757}],"concepts":[{"id":"https://openalex.org/C27050352","wikidata":"https://www.wikidata.org/wiki/Q173605","display_name":"PMOS logic","level":4,"score":0.7132986187934875},{"id":"https://openalex.org/C105339364","wikidata":"https://www.wikidata.org/wiki/Q2297740","display_name":"Software deployment","level":2,"score":0.6487184762954712},{"id":"https://openalex.org/C197162436","wikidata":"https://www.wikidata.org/wiki/Q83908","display_name":"NMOS logic","level":4,"score":0.6445410847663879},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6036589741706848},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5465904474258423},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.534796416759491},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.5120909214019775},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.42584678530693054},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.41241276264190674},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.3733680844306946},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3469180464744568},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2946165204048157},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.27264276146888733},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2096017599105835},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.14665573835372925},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.12316030263900757}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/esscirc.2016.7598332","is_oa":false,"landing_page_url":"https://doi.org/10.1109/esscirc.2016.7598332","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ESSCIRC Conference 2016: 42nd European Solid-State Circuits Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1970023301","https://openalex.org/W1984863066","https://openalex.org/W1998246226","https://openalex.org/W2007609366","https://openalex.org/W2010176811","https://openalex.org/W2069455478","https://openalex.org/W2112414127"],"related_works":["https://openalex.org/W4386261925","https://openalex.org/W2048420745","https://openalex.org/W2082944690","https://openalex.org/W2263373136","https://openalex.org/W1914349328","https://openalex.org/W2160067645","https://openalex.org/W2023334077","https://openalex.org/W2005494397","https://openalex.org/W2104885411","https://openalex.org/W2339836056"],"abstract_inverted_index":{"This":[0,43],"paper":[1],"presents":[2],"novel":[3],"6-T":[4],"SRAM":[5],"register":[6],"file":[7],"(RF)":[8],"circuits":[9,22,118],"and":[10,54,59,66,107,119],"in-field":[11],"framework":[12,92,120],"for":[13],"managing":[14],"chip's":[15,113,136],"lifetime":[16],"after":[17],"deployment.":[18],"Our":[19],"proposed":[20,90,116,156],"RF":[21,38,100,134,162],"can":[23,93,121,139],"in-situ":[24],"sense":[25],"threshold":[26],"voltages":[27],"(Vt)":[28],"of":[29,33,51,98,132,143,153],"all":[30],"six":[31],"transistors":[32],"every":[34,125],"bitcell":[35],"in":[36,71],"an":[37,99,133],"robustly":[39],"against":[40],"temperature":[41,62],"variations.":[42],"allows":[44],"us":[45],"(1)":[46],"to":[47,68,128,146,159],"monitor":[48,69],"aging":[49],"effects":[50],"both":[52],"NMOS":[53],"PMOS":[55],"such":[56,101],"as":[57,102],"negative":[58],"positive":[60],"bias":[61],"instabilities":[63],"(NBTI,":[64],"PBTI)":[65],"(2)":[67],"those":[70],"the":[72,130,141,144],"post":[73],"deployment":[74],"condition":[75],"where":[76],"environmental":[77],"parameters,":[78],"notably":[79],"temperature,":[80],"cannot":[81],"be":[82,122],"easily":[83],"controlled.":[84],"Using":[85],"these":[86],"sensed":[87],"Vt's,":[88],"our":[89,115,155],"post-deployment":[91],"estimate":[94],"critical":[95],"circuit-level":[96],"parameters":[97],"data":[103],"retention":[104],"voltage":[105],"(DRV)":[106],"read":[108],"access":[109],"time":[110],"(TACC).":[111],"After":[112],"deployment,":[114],"sensing":[117,157],"periodically":[123],"(e.g.,":[124],"month)":[126],"exercised":[127],"diagnose":[129],"reliability":[131],"through":[135],"lifetime.":[137],"We":[138],"use":[140],"results":[142],"diagnosis":[145],"potentially":[147],"trigger":[148],"countermeasures.":[149],"The":[150],"area":[151],"overhead":[152],"adding":[154],"capability":[158],"a":[160],"32\u00d732b":[161],"is":[163],"8.5%.":[164]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}