{"id":"https://openalex.org/W2154227580","doi":"https://doi.org/10.1109/icpr.2008.4761084","title":"Linear discriminant analysis for data with subcluster structure","display_name":"Linear discriminant analysis for data with subcluster structure","publication_year":2008,"publication_date":"2008-12-01","ids":{"openalex":"https://openalex.org/W2154227580","doi":"https://doi.org/10.1109/icpr.2008.4761084","mag":"2154227580"},"language":"en","primary_location":{"id":"doi:10.1109/icpr.2008.4761084","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icpr.2008.4761084","pdf_url":null,"source":{"id":"https://openalex.org/S4393916651","display_name":"Proceedings - International Conference on Pattern Recognition/Proceedings/International Conference on Pattern Recognition","issn_l":"1041-3278","issn":["1041-3278","1051-4651"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 19th International Conference on Pattern Recognition","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101728710","display_name":"Haesun Park","orcid":"https://orcid.org/0000-0001-6259-7170"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Haesun Park","raw_affiliation_strings":["College of Computing, Georgia Institute of Technology, Atlanta, GA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Computing, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047912015","display_name":"Jaegul Choo","orcid":"https://orcid.org/0000-0003-1071-4835"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jaegul Choo","raw_affiliation_strings":["College of Computing, Georgia Institute of Technology, Atlanta, GA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Computing, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047863978","display_name":"Barry Drake","orcid":"https://orcid.org/0000-0003-4087-1524"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Barry L. Drake","raw_affiliation_strings":["SEAL/AMDD, Georgia Tech Research Institute, Georgia Institute of Technology, Smyrna, GA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SEAL/AMDD, Georgia Tech Research Institute, Georgia Institute of Technology, Smyrna, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023775985","display_name":"Jinwoo Kang","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jinwoo Kang","raw_affiliation_strings":["Center for Signal & Image Processing, Georgia Institute of Technology, Atlanta, GA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Signal & Image Processing, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":1.2955,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.77017638,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10057","display_name":"Face and Expression Recognition","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10057","display_name":"Face and Expression Recognition","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10824","display_name":"Image Retrieval and Classification Techniques","score":0.9901999831199646,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10689","display_name":"Remote-Sensing Image Classification","score":0.9750999808311462,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/linear-discriminant-analysis","display_name":"Linear discriminant analysis","score":0.8919976353645325},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.7408695816993713},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7067648768424988},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6193118691444397},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.5399821400642395},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.45993828773498535},{"id":"https://openalex.org/keywords/principal-component-analysis","display_name":"Principal component analysis","score":0.4222410321235657},{"id":"https://openalex.org/keywords/discriminant","display_name":"Discriminant","score":0.4214390516281128},{"id":"https://openalex.org/keywords/hierarchical-clustering","display_name":"Hierarchical clustering","score":0.41948238015174866},{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.17619934678077698}],"concepts":[{"id":"https://openalex.org/C69738355","wikidata":"https://www.wikidata.org/wiki/Q1228929","display_name":"Linear discriminant analysis","level":2,"score":0.8919976353645325},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.7408695816993713},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7067648768424988},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6193118691444397},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.5399821400642395},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.45993828773498535},{"id":"https://openalex.org/C27438332","wikidata":"https://www.wikidata.org/wiki/Q2873","display_name":"Principal component analysis","level":2,"score":0.4222410321235657},{"id":"https://openalex.org/C78397625","wikidata":"https://www.wikidata.org/wiki/Q192487","display_name":"Discriminant","level":2,"score":0.4214390516281128},{"id":"https://openalex.org/C92835128","wikidata":"https://www.wikidata.org/wiki/Q1277447","display_name":"Hierarchical clustering","level":3,"score":0.41948238015174866},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.17619934678077698},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/icpr.2008.4761084","is_oa":false,"landing_page_url":"https://doi.org/10.1109/icpr.2008.4761084","pdf_url":null,"source":{"id":"https://openalex.org/S4393916651","display_name":"Proceedings - International Conference on Pattern Recognition/Proceedings/International Conference on Pattern Recognition","issn_l":"1041-3278","issn":["1041-3278","1051-4651"],"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2008 19th International Conference on Pattern Recognition","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.212.6617","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.212.6617","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.cc.gatech.edu/~hpark/papers/icpr_hlda.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/10","score":0.7400000095367432,"display_name":"Reduced inequalities"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2046649434","https://openalex.org/W2056003151","https://openalex.org/W2085535170","https://openalex.org/W2131691213","https://openalex.org/W2145977092","https://openalex.org/W2164552042","https://openalex.org/W4238240379","https://openalex.org/W6681363128","https://openalex.org/W6684325320"],"related_works":["https://openalex.org/W2052589448","https://openalex.org/W2765337000","https://openalex.org/W3104072235","https://openalex.org/W2391447249","https://openalex.org/W2312955079","https://openalex.org/W2350751952","https://openalex.org/W2350996391","https://openalex.org/W1999647744","https://openalex.org/W2362114017","https://openalex.org/W2066119650"],"abstract_inverted_index":{"Linear":[0],"discriminant":[1],"analysis":[2],"(LDA)":[3],"is":[4,30],"a":[5,23,61],"widely-used":[6],"feature":[7],"extraction":[8],"method":[9],"in":[10,32,73],"classification.":[11],"However,":[12],"the":[13,20,50,53,74],"original":[14],"LDA":[15],"has":[16],"limitations":[17],"due":[18],"to":[19],"assumption":[21],"of":[22,52],"unimodal":[24],"structure":[25],"for":[26],"each":[27],"cluster,":[28],"which":[29,66],"satisfied":[31],"many":[33],"applications":[34],"such":[35,42],"as":[36,43],"facial":[37],"image":[38],"data":[39,75],"when":[40],"variations":[41],"angle":[44],"and":[45,89],"illumination":[46],"can":[47],"significantly":[48],"influence":[49],"images":[51],"same":[54],"person.":[55],"In":[56],"this":[57],"paper,":[58],"we":[59],"propose":[60],"novel":[62],"method,":[63],"hierarchical":[64,70],"LDA(h-LDA),":[65],"takes":[67],"into":[68],"account":[69],"subcluster":[71],"structures":[72],"sets.":[76],"Our":[77],"experiments":[78],"show":[79],"that":[80],"regularized":[81],"h-LDA":[82],"produces":[83],"better":[84],"accuracy":[85],"than":[86],"LDA,":[87],"PCA,":[88],"tensorFaces.":[90]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2025-10-10T00:00:00"}