{"id":"https://openalex.org/W2028712278","doi":"https://doi.org/10.1109/mcsoc.2014.53","title":"Performance Validation of the Multicore SoC for Spacecraft Applications","display_name":"Performance Validation of the Multicore SoC for Spacecraft Applications","publication_year":2014,"publication_date":"2014-09-01","ids":{"openalex":"https://openalex.org/W2028712278","doi":"https://doi.org/10.1109/mcsoc.2014.53","mag":"2028712278"},"language":"en","primary_location":{"id":"doi:10.1109/mcsoc.2014.53","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mcsoc.2014.53","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE 8th International Symposium on Embedded Multicore/Manycore SoCs","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038760224","display_name":"Feiyao Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I194716290","display_name":"China Academy of Space Technology","ror":"https://ror.org/025397a59","country_code":"CN","type":"government","lineage":["https://openalex.org/I194716290","https://openalex.org/I2802615301"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feiyao Wang","raw_affiliation_strings":["Electronic Components Reliability Center China Academy of Space Technology, Beijing, China","Electron. Components Reliability Center, China Acad. of Space Technol., Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronic Components Reliability Center China Academy of Space Technology, Beijing, China","institution_ids":["https://openalex.org/I194716290"]},{"raw_affiliation_string":"Electron. Components Reliability Center, China Acad. of Space Technol., Beijing, China","institution_ids":["https://openalex.org/I194716290"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100754695","display_name":"Wenyan Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I194716290","display_name":"China Academy of Space Technology","ror":"https://ror.org/025397a59","country_code":"CN","type":"government","lineage":["https://openalex.org/I194716290","https://openalex.org/I2802615301"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenyan Wang","raw_affiliation_strings":["Electronic Components Reliability Center China Academy of Space Technology, Beijing, China","Electron. Components Reliability Center, China Acad. of Space Technol., Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electronic Components Reliability Center China Academy of Space Technology, Beijing, China","institution_ids":["https://openalex.org/I194716290"]},{"raw_affiliation_string":"Electron. Components Reliability Center, China Acad. of Space Technol., Beijing, China","institution_ids":["https://openalex.org/I194716290"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I194716290"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"329","last_page":"332"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/multi-core-processor","display_name":"Multi-core processor","score":0.7666876316070557},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6659691333770752},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5874894857406616},{"id":"https://openalex.org/keywords/spacecraft","display_name":"Spacecraft","score":0.5519275069236755},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.47616904973983765},{"id":"https://openalex.org/keywords/test-bench","display_name":"Test bench","score":0.45412933826446533},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4213183522224426},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.4139249920845032},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.1943710744380951},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17790544033050537},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.07643184065818787}],"concepts":[{"id":"https://openalex.org/C78766204","wikidata":"https://www.wikidata.org/wiki/Q555032","display_name":"Multi-core processor","level":2,"score":0.7666876316070557},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6659691333770752},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5874894857406616},{"id":"https://openalex.org/C29829512","wikidata":"https://www.wikidata.org/wiki/Q40218","display_name":"Spacecraft","level":2,"score":0.5519275069236755},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.47616904973983765},{"id":"https://openalex.org/C2776266606","wikidata":"https://www.wikidata.org/wiki/Q476482","display_name":"Test bench","level":2,"score":0.45412933826446533},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4213183522224426},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.4139249920845032},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.1943710744380951},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17790544033050537},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.07643184065818787},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/mcsoc.2014.53","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mcsoc.2014.53","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 IEEE 8th International Symposium on Embedded Multicore/Manycore SoCs","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W260727648","https://openalex.org/W1891950198","https://openalex.org/W1969474413","https://openalex.org/W1983320508","https://openalex.org/W2004437077","https://openalex.org/W2066387260","https://openalex.org/W2088256110","https://openalex.org/W2090692734","https://openalex.org/W2096241967","https://openalex.org/W2120263045","https://openalex.org/W2121938580","https://openalex.org/W2144134159","https://openalex.org/W6651354974"],"related_works":["https://openalex.org/W2898860390","https://openalex.org/W2734340365","https://openalex.org/W2118489026","https://openalex.org/W2237025049","https://openalex.org/W4377236356","https://openalex.org/W4386105384","https://openalex.org/W4384162131","https://openalex.org/W2400737216","https://openalex.org/W4387655846","https://openalex.org/W2395919370"],"abstract_inverted_index":{"With":[0],"increasingly":[1],"using":[2],"for":[3,20],"spacecraft":[4],"applications":[5],"which":[6],"demand":[7],"the":[8,12,41,46,72,75,84,89,93,97,102,105,108,113],"high":[9,26,29],"reliability,":[10],"validating":[11,83],"performance":[13,50,54,87],"of":[14,24,45,74,82,88,101],"Multicore":[15,47],"SoC":[16,90],"is":[17,115],"extremely":[18],"important":[19],"its":[21],"significant":[22],"properties":[23,44],"over-complexity,":[25],"integration":[27],"level,":[28],"processing":[30],"rate":[31],"and":[32,43,56,71,117],"miniaturized":[33],"feature":[34],"size.":[35],"In":[36],"this":[37],"paper,":[38],"we":[39],"discuss":[40],"objective":[42],"SoC's":[48],"post-silicon":[49],"validation":[51],"base":[52,104],"general":[53],"validation,":[55],"proposed":[57],"a":[58,62,68],"method":[59,114],"to":[60,91],"validate":[61],"certain":[63],"quad-core":[64],"SoC,":[65],"including":[66],"forming":[67],"test":[69,109],"bench":[70],"flow":[73],"test.":[76],"We":[77],"also":[78],"take":[79],"an":[80],"example":[81],"irradiation":[85],"hardened":[86],"explain":[92],"method,":[94],"after":[95],"analyzing":[96],"SEU,":[98],"SEFI,":[99],"SEL":[100],"part":[103],"testing":[106],"data,":[107],"result":[110],"shows":[111],"that":[112],"beneficial":[116],"effective.":[118]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}