{"id":"https://openalex.org/W2108361034","doi":"https://doi.org/10.1109/mdt.2008.83","title":"Survey of Scan Chain Diagnosis","display_name":"Survey of Scan Chain Diagnosis","publication_year":2008,"publication_date":"2008-05-01","ids":{"openalex":"https://openalex.org/W2108361034","doi":"https://doi.org/10.1109/mdt.2008.83","mag":"2108361034"},"language":"en","primary_location":{"id":"doi:10.1109/mdt.2008.83","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2008.83","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101775144","display_name":"Yu Huang","orcid":"https://orcid.org/0000-0003-2619-4686"},"institutions":[{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yu Huang","raw_affiliation_strings":["Mentor Graphics, Marlborough, MA, USA","Mentor Graphics, Wilsonville OR"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mentor Graphics, Marlborough, MA, USA","institution_ids":["https://openalex.org/I4210156212"]},{"raw_affiliation_string":"Mentor Graphics, Wilsonville OR","institution_ids":["https://openalex.org/I4210156212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019655330","display_name":"Ruifeng Guo","orcid":"https://orcid.org/0009-0000-9075-1884"},"institutions":[{"id":"https://openalex.org/I105695857","display_name":"Siemens (Hungary)","ror":"https://ror.org/01rk7mv85","country_code":"HU","type":"company","lineage":["https://openalex.org/I105695857","https://openalex.org/I1325886976"]},{"id":"https://openalex.org/I4210099704","display_name":"Mentor","ror":"https://ror.org/016grqh48","country_code":"GB","type":"nonprofit","lineage":["https://openalex.org/I4210099704"]},{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["GB","HU","US"],"is_corresponding":false,"raw_author_name":"Ruifeng Guo","raw_affiliation_strings":["Mentor Graphics","Mentor Graphics, Wilsonville OR"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mentor Graphics","institution_ids":["https://openalex.org/I105695857","https://openalex.org/I4210099704"]},{"raw_affiliation_string":"Mentor Graphics, Wilsonville OR","institution_ids":["https://openalex.org/I4210156212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020407423","display_name":"Wu-Tung Cheng","orcid":"https://orcid.org/0000-0001-6327-2394"},"institutions":[{"id":"https://openalex.org/I105695857","display_name":"Siemens (Hungary)","ror":"https://ror.org/01rk7mv85","country_code":"HU","type":"company","lineage":["https://openalex.org/I105695857","https://openalex.org/I1325886976"]},{"id":"https://openalex.org/I4210099704","display_name":"Mentor","ror":"https://ror.org/016grqh48","country_code":"GB","type":"nonprofit","lineage":["https://openalex.org/I4210099704"]},{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["GB","HU","US"],"is_corresponding":false,"raw_author_name":"Wu-Tung Cheng","raw_affiliation_strings":["Mentor Graphics","Mentor Graphics, Wilsonville OR"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mentor Graphics","institution_ids":["https://openalex.org/I105695857","https://openalex.org/I4210099704"]},{"raw_affiliation_string":"Mentor Graphics, Wilsonville OR","institution_ids":["https://openalex.org/I4210156212"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017361488","display_name":"James Chien-Mo Li","orcid":"https://orcid.org/0000-0002-4393-5186"},"institutions":[{"id":"https://openalex.org/I16733864","display_name":"National Taiwan University","ror":"https://ror.org/05bqach95","country_code":"TW","type":"education","lineage":["https://openalex.org/I16733864"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"James Chien-Mo Li","raw_affiliation_strings":["National Taiwan University","National Taiwan University > > > >  >  >"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Taiwan University","institution_ids":["https://openalex.org/I16733864"]},{"raw_affiliation_string":"National Taiwan University > > > >  >  >","institution_ids":["https://openalex.org/I16733864"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.3511,"has_fulltext":false,"cited_by_count":88,"citation_normalized_percentile":{"value":0.8866624,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"25","issue":"3","first_page":"240","last_page":"248"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9936000108718872,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.9646885991096497},{"id":"https://openalex.org/keywords/boundary-scan","display_name":"Boundary scan","score":0.7556184530258179},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5116065144538879},{"id":"https://openalex.org/keywords/scan-line","display_name":"Scan line","score":0.5077649354934692},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.47787609696388245},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.42938846349716187},{"id":"https://openalex.org/keywords/helical-scan","display_name":"Helical scan","score":0.4212656021118164},{"id":"https://openalex.org/keywords/chain","display_name":"Chain (unit)","score":0.4210051894187927},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.41633912920951843},{"id":"https://openalex.org/keywords/sequential-logic","display_name":"Sequential logic","score":0.4101671278476715},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.3119480013847351},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.23945114016532898},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.20644965767860413},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1999833881855011},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18868783116340637},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.138802170753479},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.11485671997070312}],"concepts":[{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.9646885991096497},{"id":"https://openalex.org/C992767","wikidata":"https://www.wikidata.org/wiki/Q895156","display_name":"Boundary scan","level":3,"score":0.7556184530258179},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5116065144538879},{"id":"https://openalex.org/C142748172","wikidata":"https://www.wikidata.org/wiki/Q3240002","display_name":"Scan line","level":4,"score":0.5077649354934692},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.47787609696388245},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.42938846349716187},{"id":"https://openalex.org/C188256105","wikidata":"https://www.wikidata.org/wiki/Q1759953","display_name":"Helical scan","level":4,"score":0.4212656021118164},{"id":"https://openalex.org/C199185054","wikidata":"https://www.wikidata.org/wiki/Q552299","display_name":"Chain (unit)","level":2,"score":0.4210051894187927},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.41633912920951843},{"id":"https://openalex.org/C187075797","wikidata":"https://www.wikidata.org/wiki/Q173245","display_name":"Sequential logic","level":3,"score":0.4101671278476715},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.3119480013847351},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.23945114016532898},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.20644965767860413},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1999833881855011},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18868783116340637},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.138802170753479},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.11485671997070312},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2776140076","wikidata":"https://www.wikidata.org/wiki/Q193663","display_name":"Magnetic tape","level":3,"score":0.0},{"id":"https://openalex.org/C78201319","wikidata":"https://www.wikidata.org/wiki/Q685727","display_name":"Grayscale","level":3,"score":0.0},{"id":"https://openalex.org/C2780415423","wikidata":"https://www.wikidata.org/wiki/Q2473736","display_name":"Digital recording","level":2,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/mdt.2008.83","is_oa":false,"landing_page_url":"https://doi.org/10.1109/mdt.2008.83","pdf_url":null,"source":{"id":"https://openalex.org/S73404582","display_name":"IEEE Design & Test of Computers","issn_l":"0740-7475","issn":["0740-7475","1558-1918"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Design & Test of Computers","raw_type":"journal-article"},{"id":"pmh:oai:140.112.114.62:246246/144083","is_oa":false,"landing_page_url":"http://ntur.lib.ntu.edu.tw//handle/246246/144083","pdf_url":null,"source":{"id":"https://openalex.org/S4306402491","display_name":"NTUR (\u81fa\u7063\u6a5f\u69cb\u5178\u85cf)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I16733864","host_organization_name":"National Taiwan University","host_organization_lineage":["https://openalex.org/I16733864"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"article"},{"id":"pmh:oai:140.112.114.62:246246/215443","is_oa":false,"landing_page_url":"http://ntur.lib.ntu.edu.tw//handle/246246/215443","pdf_url":null,"source":{"id":"https://openalex.org/S4306402491","display_name":"NTUR (\u81fa\u7063\u6a5f\u69cb\u5178\u85cf)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I16733864","host_organization_name":"National Taiwan University","host_organization_lineage":["https://openalex.org/I16733864"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":49,"referenced_works":["https://openalex.org/W1487528602","https://openalex.org/W1502879325","https://openalex.org/W1521778956","https://openalex.org/W1835662651","https://openalex.org/W1930974068","https://openalex.org/W1935520078","https://openalex.org/W1971016512","https://openalex.org/W2009698782","https://openalex.org/W2037589385","https://openalex.org/W2048761470","https://openalex.org/W2054963492","https://openalex.org/W2078877037","https://openalex.org/W2102485710","https://openalex.org/W2106507634","https://openalex.org/W2108440155","https://openalex.org/W2110731889","https://openalex.org/W2117889864","https://openalex.org/W2122520060","https://openalex.org/W2123072391","https://openalex.org/W2130044303","https://openalex.org/W2136360046","https://openalex.org/W2139664386","https://openalex.org/W2144727130","https://openalex.org/W2147576441","https://openalex.org/W2148277259","https://openalex.org/W2149494283","https://openalex.org/W2149546205","https://openalex.org/W2153853156","https://openalex.org/W2153923571","https://openalex.org/W2155038322","https://openalex.org/W2156332534","https://openalex.org/W2157200201","https://openalex.org/W2160713416","https://openalex.org/W2167258210","https://openalex.org/W2170538292","https://openalex.org/W2211188787","https://openalex.org/W2250123807","https://openalex.org/W2295201395","https://openalex.org/W3115008418","https://openalex.org/W3117046516","https://openalex.org/W3117049843","https://openalex.org/W3117515105","https://openalex.org/W3151279858","https://openalex.org/W4242603018","https://openalex.org/W4250719489","https://openalex.org/W4253957545","https://openalex.org/W4300938752","https://openalex.org/W6676788373","https://openalex.org/W6683494264"],"related_works":["https://openalex.org/W2117171289","https://openalex.org/W1852363244","https://openalex.org/W2127184179","https://openalex.org/W2102314186","https://openalex.org/W2001654810","https://openalex.org/W2172250424","https://openalex.org/W2131620625","https://openalex.org/W2012436574","https://openalex.org/W2121956161","https://openalex.org/W1501621551"],"abstract_inverted_index":{"Scan-based":[0],"testing":[1,25],"has":[2,59],"proven":[3],"to":[4,74,107,146],"be":[5],"a":[6,56,85,89,118,123,127,137,159,183],"cost-effective":[7],"method":[8],"for":[9],"achieving":[10],"good":[11],"test":[12,108,120,147],"coverage":[13],"in":[14,20,55,65],"digital":[15],"circuits.":[16],"The":[17,33,63,101,140,150,174],"Achilles":[18],"heel":[19],"the":[21,27,30,66,154,167,178,191],"application":[22],"of":[23,29,35,92,103,126,142,170,194],"scan-based":[24],"is":[26,88,106,122,145],"integrity":[28],"scan":[31,40,53,57,72,75,109,113,143,151,155,160,162,172,175,179,184,186,196],"chains.":[32],"amount":[34],"die":[36],"area":[37],"consumed":[38],"by":[39],"elements,":[41],"chain":[42,58,67,81,104,110,156,180],"connections,":[43],"and":[44,94,136,158,182],"control":[45],"circuitry":[46],"varies":[47],"with":[48,78],"different":[49],"designs.":[50],"Typically,":[51],"each":[52],"cell":[54],"an":[60],"index":[61],"number.":[62],"cells":[64,152,169,176,193],"are":[68,165,189],"sequentially":[69],"numbered":[70],"from":[71],"output":[73,181,187],"input,":[76],"starting":[77],"0.":[79],"A":[80,112],"pattern":[82,90,114,124],"(sometimes":[83],"called":[84,166,190],"flush":[86],"pattern)":[87,121],"consisting":[91,125],"shift-in":[93,128],"shift-out":[95,138],"operations":[96],"without":[97],"pulsing":[98],"capture":[99,133],"clocks.":[100],"purpose":[102,141],"patterns":[105,144],"integrity.":[111],"(also":[115],"known":[116],"as":[117],"logic":[119],"operation,":[129],"one":[130],"or":[131],"multiple":[132],"clock":[134],"cycles,":[135],"operation.":[139],"system":[148],"logic.":[149],"between":[153,177],"input":[157,163],"cell's":[161,185],"terminal":[164,188],"upstream":[168],"that":[171,195],"cell.":[173,197],"downstream":[192]},"counts_by_year":[{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":9},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":8},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":4},{"year":2016,"cited_by_count":7},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}