{"id":"https://openalex.org/W2979722875","doi":"https://doi.org/10.1109/tcad.2019.2945760","title":"Low Cost Hypercompression of Test Data","display_name":"Low Cost Hypercompression of Test Data","publication_year":2019,"publication_date":"2019-10-07","ids":{"openalex":"https://openalex.org/W2979722875","doi":"https://doi.org/10.1109/tcad.2019.2945760","mag":"2979722875"},"language":"en","primary_location":{"id":"doi:10.1109/tcad.2019.2945760","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2019.2945760","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101775144","display_name":"Yu Huang","orcid":"https://orcid.org/0000-0003-2619-4686"},"institutions":[{"id":"https://openalex.org/I4210137693","display_name":"Siemens (United States)","ror":"https://ror.org/04axb7e79","country_code":"US","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I4210137693"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yu Huang","raw_affiliation_strings":["Mentor, A Siemens Business, Wilsonville, USA"],"raw_orcid":"https://orcid.org/0000-0003-2619-4686","affiliations":[{"raw_affiliation_string":"Mentor, A Siemens Business, Wilsonville, USA","institution_ids":["https://openalex.org/I4210137693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074272792","display_name":"Sylwester Milewski","orcid":null},"institutions":[{"id":"https://openalex.org/I46597724","display_name":"Pozna\u0144 University of Technology","ror":"https://ror.org/00p7p3302","country_code":"PL","type":"education","lineage":["https://openalex.org/I46597724"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Sylwester Milewski","raw_affiliation_strings":["Faculty of Electronics and Telecommunications, Pozna\u0144 University of Technology, Pozna\u0144, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Electronics and Telecommunications, Pozna\u0144 University of Technology, Pozna\u0144, Poland","institution_ids":["https://openalex.org/I46597724"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080960636","display_name":"Janusz Rajski","orcid":"https://orcid.org/0000-0003-2124-447X"},"institutions":[{"id":"https://openalex.org/I4210137693","display_name":"Siemens (United States)","ror":"https://ror.org/04axb7e79","country_code":"US","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I4210137693"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Janusz Rajski","raw_affiliation_strings":["Mentor, A Siemens Business, Wilsonville, USA"],"raw_orcid":"https://orcid.org/0000-0003-2124-447X","affiliations":[{"raw_affiliation_string":"Mentor, A Siemens Business, Wilsonville, USA","institution_ids":["https://openalex.org/I4210137693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072675590","display_name":"Jerzy Tyszer","orcid":"https://orcid.org/0000-0001-9722-2344"},"institutions":[{"id":"https://openalex.org/I46597724","display_name":"Pozna\u0144 University of Technology","ror":"https://ror.org/00p7p3302","country_code":"PL","type":"education","lineage":["https://openalex.org/I46597724"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Jerzy Tyszer","raw_affiliation_strings":["Faculty of Electronics and Telecommunications, Pozna\u0144 University of Technology, Pozna\u0144, Poland"],"raw_orcid":"https://orcid.org/0000-0001-9722-2344","affiliations":[{"raw_affiliation_string":"Faculty of Electronics and Telecommunications, Pozna\u0144 University of Technology, Pozna\u0144, Poland","institution_ids":["https://openalex.org/I46597724"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100337582","display_name":"Chen Wang","orcid":"https://orcid.org/0000-0002-4630-0805"},"institutions":[{"id":"https://openalex.org/I4210137693","display_name":"Siemens (United States)","ror":"https://ror.org/04axb7e79","country_code":"US","type":"company","lineage":["https://openalex.org/I1325886976","https://openalex.org/I4210137693"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chen Wang","raw_affiliation_strings":["Mentor, A Siemens Business, Wilsonville, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mentor, A Siemens Business, Wilsonville, USA","institution_ids":["https://openalex.org/I4210137693"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.6759,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.83881666,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"39","issue":"10","first_page":"2964","last_page":"2975"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9933000206947327,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.8117092847824097},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.805464506149292},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.7841423749923706},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6633784770965576},{"id":"https://openalex.org/keywords/cube","display_name":"Cube (algebra)","score":0.6568450927734375},{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.6050413250923157},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.5478536486625671},{"id":"https://openalex.org/keywords/encoding","display_name":"Encoding (memory)","score":0.5148455500602722},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.49155697226524353},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.46346771717071533},{"id":"https://openalex.org/keywords/compression","display_name":"Compression (physics)","score":0.46288323402404785},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4358150064945221},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.42679816484451294},{"id":"https://openalex.org/keywords/template","display_name":"Template","score":0.41298508644104004},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4092062711715698},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3818940222263336},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.38034507632255554},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.26982060074806213},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18196174502372742},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.1685633659362793},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11188727617263794},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.07566970586776733},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07520624995231628}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.8117092847824097},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.805464506149292},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.7841423749923706},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6633784770965576},{"id":"https://openalex.org/C53051483","wikidata":"https://www.wikidata.org/wiki/Q861555","display_name":"Cube (algebra)","level":2,"score":0.6568450927734375},{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.6050413250923157},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.5478536486625671},{"id":"https://openalex.org/C125411270","wikidata":"https://www.wikidata.org/wiki/Q18653","display_name":"Encoding (memory)","level":2,"score":0.5148455500602722},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.49155697226524353},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.46346771717071533},{"id":"https://openalex.org/C180016635","wikidata":"https://www.wikidata.org/wiki/Q2712821","display_name":"Compression (physics)","level":2,"score":0.46288323402404785},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4358150064945221},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.42679816484451294},{"id":"https://openalex.org/C82714645","wikidata":"https://www.wikidata.org/wiki/Q438331","display_name":"Template","level":2,"score":0.41298508644104004},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4092062711715698},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3818940222263336},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.38034507632255554},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.26982060074806213},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18196174502372742},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.1685633659362793},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11188727617263794},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07566970586776733},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07520624995231628},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tcad.2019.2945760","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tcad.2019.2945760","pdf_url":null,"source":{"id":"https://openalex.org/S100835903","display_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","issn_l":"0278-0070","issn":["0278-0070","1937-4151"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.46000000834465027}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":64,"referenced_works":["https://openalex.org/W1517139843","https://openalex.org/W1557977552","https://openalex.org/W1562699972","https://openalex.org/W1589740774","https://openalex.org/W1763985980","https://openalex.org/W1900996732","https://openalex.org/W1917503894","https://openalex.org/W1966348745","https://openalex.org/W1967660531","https://openalex.org/W1978040115","https://openalex.org/W1979305473","https://openalex.org/W1985440524","https://openalex.org/W2001352955","https://openalex.org/W2006322321","https://openalex.org/W2008990681","https://openalex.org/W2023155196","https://openalex.org/W2096852695","https://openalex.org/W2099814124","https://openalex.org/W2101818740","https://openalex.org/W2101900253","https://openalex.org/W2102404182","https://openalex.org/W2104107023","https://openalex.org/W2109043970","https://openalex.org/W2110232289","https://openalex.org/W2113809744","https://openalex.org/W2121466258","https://openalex.org/W2125014350","https://openalex.org/W2125317684","https://openalex.org/W2127737927","https://openalex.org/W2128921091","https://openalex.org/W2131432014","https://openalex.org/W2132881562","https://openalex.org/W2135615172","https://openalex.org/W2135627440","https://openalex.org/W2136567303","https://openalex.org/W2137427575","https://openalex.org/W2138284668","https://openalex.org/W2138530143","https://openalex.org/W2140283778","https://openalex.org/W2144033909","https://openalex.org/W2144888713","https://openalex.org/W2150448461","https://openalex.org/W2150895785","https://openalex.org/W2157198810","https://openalex.org/W2159871346","https://openalex.org/W2160621850","https://openalex.org/W2165516518","https://openalex.org/W2168419390","https://openalex.org/W2169451209","https://openalex.org/W2169854732","https://openalex.org/W2913503789","https://openalex.org/W3035062237","https://openalex.org/W3141221995","https://openalex.org/W4254056430","https://openalex.org/W6631122638","https://openalex.org/W6635160734","https://openalex.org/W6639759450","https://openalex.org/W6675519197","https://openalex.org/W6678356202","https://openalex.org/W6679099873","https://openalex.org/W6680410900","https://openalex.org/W6681008240","https://openalex.org/W6684123354","https://openalex.org/W6685002992"],"related_works":["https://openalex.org/W2789883751","https://openalex.org/W2147986372","https://openalex.org/W1979305473","https://openalex.org/W2274367941","https://openalex.org/W1974621628","https://openalex.org/W3088373974","https://openalex.org/W2035832568","https://openalex.org/W1581610324","https://openalex.org/W2129124567","https://openalex.org/W2146547687"],"abstract_inverted_index":{"This":[0],"article":[1],"presents":[2],"a":[3,55,65,69,99,128],"next-generation":[4],"test":[5,43,60,87,94,111,130],"data":[6],"compression":[7,14,31,48],"scheme.":[8,133],"It":[9],"builds":[10],"on":[11],"the":[12,80,147,150],"isometric":[13],"paradigm,":[15],"but":[16],"makes":[17],"it":[18],"more":[19],"flexible":[20],"and":[21,45,101,142,156],"elevates":[22],"encoding":[23],"efficiency":[24],"to":[25,91,105],"values":[26],"unachievable":[27],"through":[28],"state-of-the-art":[29],"sequential":[30],"schemes.":[32],"Furthermore,":[33],"its":[34],"programmable":[35],"selection":[36],"of":[37,71,120,149],"full-toggle":[38],"scan":[39,125],"chains":[40,126],"ensures":[41],"high":[42],"coverage":[44],"virtually":[46],"eliminates":[47],"aborts.":[49],"The":[50,134],"presented":[51],"approach":[52],"follows":[53],"from":[54],"fundamental":[56],"observation":[57],"that":[58],"among":[59],"cube":[61],"care":[62],"bits,":[63],"only":[64],"very":[66],"few":[67],"have":[68,83],"status":[70],"necessary":[72],"assignments":[73,107],"(their":[74],"locations":[75],"cannot":[76],"be":[77],"changed),":[78],"whereas":[79],"remaining":[81],"ones":[82],"alternative":[84],"sites.":[85],"These":[86],"cubes":[88],"are":[89,157],"used":[90],"form":[92],"circular":[93],"templates":[95],"which":[96],"synergistically":[97],"control":[98,132],"decompressor":[100,116],"guide":[102],"back":[103],"ATPG":[104],"find":[106],"yielding":[108],"highly":[109],"compressible":[110],"patterns.":[112],"A":[113],"redesigned":[114],"low-silicon-area":[115],"is":[117],"also":[118],"capable":[119],"reducing":[121],"switching":[122],"rates":[123],"in":[124],"with":[127],"new":[129],"power":[131],"experimental":[135],"results":[136],"obtained":[137],"for":[138],"large":[139],"industrial":[140],"designs":[141],"other":[143],"benchmark":[144],"circuits":[145],"confirm":[146],"superiority":[148],"proposed":[151],"scheme":[152],"over":[153],"existing":[154],"techniques":[155],"reported":[158],"herein.":[159]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}