{"id":"https://openalex.org/W1971649997","doi":"https://doi.org/10.1145/1973009.1973097","title":"Analyzing throughput of power and thermal-constraint multicore processor under NBTI effect","display_name":"Analyzing throughput of power and thermal-constraint multicore processor under NBTI effect","publication_year":2011,"publication_date":"2011-05-02","ids":{"openalex":"https://openalex.org/W1971649997","doi":"https://doi.org/10.1145/1973009.1973097","mag":"1971649997"},"language":"en","primary_location":{"id":"doi:10.1145/1973009.1973097","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1973009.1973097","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 21st edition of the great lakes symposium on Great lakes symposium on VLSI","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048035749","display_name":"Shi-Qun Zheng","orcid":null},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shi-Qun Zheng","raw_affiliation_strings":["National Cheng Kung University, Tainan, Taiwan Roc","National Cheng-Kung University, Tainan, Taiwan, ROC#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Cheng Kung University, Tainan, Taiwan Roc","institution_ids":["https://openalex.org/I91807558"]},{"raw_affiliation_string":"National Cheng-Kung University, Tainan, Taiwan, ROC#TAB#","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101864424","display_name":"Ing-Chao Lin","orcid":"https://orcid.org/0000-0003-1994-7512"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ing-Chao Lin","raw_affiliation_strings":["National Cheng Kung University, Tainan, Taiwan Roc","National Cheng-Kung University, Tainan, Taiwan, ROC#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Cheng Kung University, Tainan, Taiwan Roc","institution_ids":["https://openalex.org/I91807558"]},{"raw_affiliation_string":"National Cheng-Kung University, Tainan, Taiwan, ROC#TAB#","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000265921","display_name":"Yen\u2010Han Lee","orcid":"https://orcid.org/0000-0003-4869-1982"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yen-Han Lee","raw_affiliation_strings":["National Cheng Kung University, Tainan, Taiwan Roc","National Cheng-Kung University, Tainan, Taiwan, ROC#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Cheng Kung University, Tainan, Taiwan Roc","institution_ids":["https://openalex.org/I91807558"]},{"raw_affiliation_string":"National Cheng-Kung University, Tainan, Taiwan, ROC#TAB#","institution_ids":["https://openalex.org/I91807558"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I91807558"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"415","last_page":"418"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/negative-bias-temperature-instability","display_name":"Negative-bias temperature instability","score":0.8550260663032532},{"id":"https://openalex.org/keywords/pmos-logic","display_name":"PMOS logic","score":0.8541658520698547},{"id":"https://openalex.org/keywords/throughput","display_name":"Throughput","score":0.7691542506217957},{"id":"https://openalex.org/keywords/multi-core-processor","display_name":"Multi-core processor","score":0.7357296943664551},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6487436890602112},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5157139897346497},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5103563666343689},{"id":"https://openalex.org/keywords/constraint","display_name":"Constraint (computer-aided design)","score":0.48950326442718506},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4704191982746124},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.4537206292152405},{"id":"https://openalex.org/keywords/core","display_name":"Core (optical fiber)","score":0.4139740467071533},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.4016862213611603},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3757559061050415},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3568376898765564},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.35206496715545654},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.33553558588027954},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.22438275814056396},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.16947755217552185},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14341646432876587},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07033604383468628}],"concepts":[{"id":"https://openalex.org/C557185","wikidata":"https://www.wikidata.org/wiki/Q6987194","display_name":"Negative-bias temperature instability","level":5,"score":0.8550260663032532},{"id":"https://openalex.org/C27050352","wikidata":"https://www.wikidata.org/wiki/Q173605","display_name":"PMOS logic","level":4,"score":0.8541658520698547},{"id":"https://openalex.org/C157764524","wikidata":"https://www.wikidata.org/wiki/Q1383412","display_name":"Throughput","level":3,"score":0.7691542506217957},{"id":"https://openalex.org/C78766204","wikidata":"https://www.wikidata.org/wiki/Q555032","display_name":"Multi-core processor","level":2,"score":0.7357296943664551},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6487436890602112},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5157139897346497},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5103563666343689},{"id":"https://openalex.org/C2776036281","wikidata":"https://www.wikidata.org/wiki/Q48769818","display_name":"Constraint (computer-aided design)","level":2,"score":0.48950326442718506},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4704191982746124},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.4537206292152405},{"id":"https://openalex.org/C2164484","wikidata":"https://www.wikidata.org/wiki/Q5170150","display_name":"Core (optical fiber)","level":2,"score":0.4139740467071533},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.4016862213611603},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3757559061050415},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3568376898765564},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.35206496715545654},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.33553558588027954},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.22438275814056396},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.16947755217552185},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14341646432876587},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07033604383468628},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1145/1973009.1973097","is_oa":false,"landing_page_url":"https://doi.org/10.1145/1973009.1973097","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the 21st edition of the great lakes symposium on Great lakes symposium on VLSI","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.821.5268","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.821.5268","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://udd.ord.ncku.edu.tw/ezfiles/78/1078/img/508/990124%282%29.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.7300000190734863,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1982849154","https://openalex.org/W1995516682","https://openalex.org/W2079942837","https://openalex.org/W2117276753","https://openalex.org/W2154169726","https://openalex.org/W2155810574","https://openalex.org/W2156064231","https://openalex.org/W2164178706"],"related_works":["https://openalex.org/W1999919743","https://openalex.org/W2081382200","https://openalex.org/W2100282217","https://openalex.org/W2157278395","https://openalex.org/W2164047446","https://openalex.org/W2096191509","https://openalex.org/W2126351224","https://openalex.org/W3033168326","https://openalex.org/W2609002938","https://openalex.org/W2117835845"],"abstract_inverted_index":{"NBTI":[0,29,93],"(Negative":[1],"Bias":[2],"Temperature":[3],"Instability)":[4],"which":[5],"can":[6],"degrade":[7],"the":[8,25,54,68],"switching":[9],"speed":[10],"of":[11,28,56,70],"PMOS":[12],"transistors":[13],"has":[14],"become":[15],"a":[16],"major":[17],"reliability":[18],"challenge.":[19],"In":[20,101],"this":[21],"paper,":[22],"we":[23,52],"investigate":[24],"throughput":[26,69,90,110],"impact":[27],"on":[30],"power":[31,71],"and":[32,36,47,62,72],"thermal-constraint":[33],"multicore":[34,75],"processors":[35],"show":[37],"up":[38],"to":[39,66,88,108],"30":[40],"%":[41,82],"degradation":[42],"when":[43,95],"both":[44],"process":[45],"variation":[46,97],"NBIT":[48],"are":[49],"considered.":[50,100],"Then":[51],"evaluate":[53],"effectiveness":[55],"core":[57],"rotation,":[58],"adaptive":[59,63],"voltage":[60],"scaling":[61],"body":[64],"biasing":[65],"improve":[67],"thermal":[73],"constrained":[74],"processors.":[76],"Our":[77],"experimental":[78],"results":[79],"demonstrate":[80],"11.1":[81],"improvement":[83],"in":[84],"VDD":[85],"is":[86,98,105],"sufficient":[87],"guarantee":[89],"after":[91],"10-yr":[92],"influence":[94],"processor":[96],"not":[99,106],"contract,":[102],"ABB":[103],"technique":[104],"able":[107],"recover":[109],"loss":[111],"caused":[112],"by":[113],"NBTI.":[114]},"counts_by_year":[],"updated_date":"2026-07-15T18:14:33.161393","created_date":"2025-10-10T00:00:00"}