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ORCID13th Asian Test Symposium 2004: Kenting, Taiwan
- 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan. IEEE Computer Society 2004, ISBN 0-7695-2235-1
Session A1: SOC Testing
- Qiang Xu, Nicola Nicolici:
Multi-Frequency Test Access Mechanism Design for Modular SOC Testing. 2-7 - Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, Anshuman Chandra:
Rapid and Energy-Efficient Testing for Embedded Cores. 8-13 - Jianhui Xing, Hong Wang, Shiyuan Yang:
Constructing Transparency Paths for IP Cores Using Greedy Searching Strategy. 14-19 - Aristides Efthymiou, John Bainbridge, Douglas A. Edwards:
Adding Testability to an Asynchronous Interconnect for GALS SoC. 20-23
Session B1: Low-Power Testing
- Kuen-Jong Lee, Shaing-Jer Hsu, Chia-Ming Ho:
Test Power Reduction with Multiple Capture Orders. 26-31 - Zhiqiang You, Ken-ichi Yamaguchi, Michiko Inoue, Jacob Savir, Hideo Fujiwara:
Power-Constrained DFT Algorithms for Non-Scan BIST-able RTL Data Paths. 32-39 - Nan-Cheng Lai, Sying-Jyan Wang, Yu-Hsuan Fu:
Low Power BIST with Smoother and Scan-Chain Reorder . 40-45 - Yoshinobu Higami, Seiji Kajihara, Shin-ya Kobayashi, Yuzo Takamatsu:
Techniques for Finding Xs in Test Sequences for Sequential Circuits and Applications to Test Length/Power Reduction. 46-49
Session C1: Analog BIST
- Hsin-Wen Ting, Bin-Da Liu, Soon-Jyh Chang:
A Time Domain Built-In Self-Test Methodology for SNDR and ENOB Tests of Analog-to-Digital Converters. 52-57 - Guan-Xun Chen, Chung-Len Lee, Jwu E. Chen:
A New BIST Scheme Based on a Summing-into-Timing-Signal Principle with Self Calibration for the DAC. 58-61 - Hao-Chiao Hong
, Cheng-Wen Wu, Kwang-Ting Cheng:
A Signa-Delta Modulation Based Analog BIST System with a Wide Bandwidth Fifth-Order Analog Response Extractor for Diagnosis Purpose. 62-67 - Soumendu Bhattacharya, Abhijit Chatterjee:
A Built-In Loopback Test Methodology for RF Transceiver Circuits Using Embedded Sensor Circuits. 68-73
Session A2: Advanced DFT
- Kohei Miyase, Seiji Kajihara, Sudhakar M. Reddy:
Multiple Scan Tree Design with Test Vector Modification. 76-81 - Jiann-Chyi Rau, Ching-Hsiu Lin, Jun-Yi Chang:
An Efficient Low-Overhead Policy for Constructing Multiple Scan-Chains. 82-87 - Dong Xiang, Ming-Jing Chen, Kaiwei Li, Yu-Liang Wu:
Scan-Based BIST Using an Improved Scan Forest Architecture. 88-93 - Il-soo Lee, Yong Min Hur, Tony Ambler:
The Efficient Multiple Scan Chain Architecture Reducing Power Dissipation and Test Time. 94-97
Session B2: Fault Analysis
- John P. Hayes, Ilia Polian, Bernd Becker:
Testing for Missing-Gate Faults in Reversible Circuits. 100-105 - Irith Pomeranz, Sudhakar M. Reddy:
Properties of Maximally Dominating Faults. 106-111 - Masaki Hashizume, Daisuke Yoneda, Hiroyuki Yotsuyanagi, Tetsuo Tada, Takeshi Koyama, Ikuro Morita, Takeomi Tamesada:
I_DDQ Test Method Based on Wavelet Transformation for Noisy Current Measurement Environment. 112-117 - Klaus Rothbart, Ulrich Neffe, Christian Steger, Reinhold Weiss, Edgar Rieger, Andreas Mühlberger:
High Level Fault Injection for Attack Simulation in Smart Cards. 118-121
Session C2: Cross-Talk Testing
- Melvin A. Breuer, Sandeep K. Gupta, Shahin Nazarian:
Efficient Identification of Crosstalk Induced Slowdown Targets. 124-131 - Wichian Sirisaengtaksin, Sandeep K. Gupta:
Modeling and Testing Crosstalk Faults in Inter-Core Interconnects that Include Tri-State and Bi-Directional Nets. 132-139 - Chung Liang Chen, Chung-Len Lee, Ming Shae Wu:
A New Path Delay Test Scheme Based on Path Delay Inertia. 140-144 - Katherine Shu-Min Li, Chung-Len Lee, Chauchin Su, Jwu E. Chen:
A Unified Approach to Detecting Crosstalk Faults of Interconnects in Deep Sub-Micron VLSI. 145-150
Session A3: Functional Testing
- Kazuko Kambe, Michiko Inoue, Hideo Fujiwara:
Efficient Template Generation for Instruction-Based Self-Test of Processor Cores. 152-157 - Saeed Shamshiri, Hadi Esmaeilzadeh, Zainalabedin Navabi:
Test Instruction Set (TIS) for High Level Self-Testing of CPU Cores. 158-163 - Chin-Lung Chuang, Dong-Jung Lu, Chien-Nan Jimmy Liu:
A Snapshot Method to Provide Full Visibility for Functional Debugging Using FPGA. 164-169 - Shiyi Xu:
A Systematic Way of Functional Testing for VLSI Chips. 170-175
Session B3: Logic BIST
- Chaowen Yu, Sudhakar M. Reddy, Irith Pomeranz:
Weighted Pseudo-Random BIST for N-Detection of Single Stuck-at Faults. 178-183 - Santosh Biswas, Siddhartha Mukhopadhyay, Amit Patra:
A BIST Approach to On-Line Monitoring of Digital VLSI Circuits: A CAD Tool. 184-189 - Masayuki Arai, Harunobu Kurokawa, Kenichi Ichino, Satoshi Fukumoto, Kazuhiko Iwasaki:
Seed Selection Procedure for LFSR-Based BIST with Multiple Scan Chains and Phase Shifters. 190-195 - Sukanta Das, Anirban Kundu, Biplab K. Sikdar:
Nonlinear CA Based Design of Test Set Generator Targeting Pseudo-Random Pattern Resistant Faults. 196-201
Session C3: Fault Diagnosis
- Wu-Tung Cheng, Kun-Han Tsai, Yu Huang, Nagesh Tamarapalli, Janusz Rajski:
Compactor Independent Direct Diagnosis. 204-209 - Swaroop Ghosh, K. W. Lai, Wen-Ben Jone, Shih-Chieh Chang:
Scan Chain Fault Identification Using Weight-Based Codes for SoC Circuits. 210-215 - Hiroshi Takahashi, Yukihiro Yamamoto, Yoshinobu Higami, Yuzo Takamatsu:
Enhancing BIST Based Single/Multiple Stuck-at Fault Diagnosis by Ambiguous Test Set. 216-221 - Yuichi Sato, Hiroshi Takahashi, Yoshinobu Higami, Yuzo Takamatsu:
Failure Analysis of Open Faults by Using Detecting/Un-detecting Information on Tests. 222-227
Session A4: SOC Test Scheduling
- Zhiyuan He, Gert Jervan, Zebo Peng, Petru Eles:
Hybrid BIST Test Scheduling Based on Defect Probabilities. 230-235 - Yu Hu, Yinhe Han, Huawei Li, Tao Lv, Xiaowei Li:
Pair Balance-Based Test Scheduling for SOCs. 236-241 - Jung-Been Im, Sunghoon Chun, Geunbae Kim, Jin-Ho Ahn, Sungho Kang:
RAIN (RAndom Insertion) Scheduling Algorithm for SoC Test. 242-247 - Wei-Lun Wang:
March Based Memory Core Test Scheduling for SOC. 248-253 - Stina Edbom, Erik Larsson:
An Integrated Technique for Test Vector Selection and Test Scheduling under Test Time Constraint. 254-257
Session B4: Memory Testing
- Chih-Tsun Huang, Jen-Chieh Yeh, Yuan-Yuan Shih, Rei-Fu Huang, Cheng-Wen Wu:
On Test and Diagnostics of Flash Memories. 260-265 - Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan:
Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution. 266-271 - Yi-Ming Sheng, Ming-Jun Hsiao, Tsin-Yuan Chang:
A Measurement Unit for Input Signal Analysis of SRAM Sense Amplifier. 272-276 - Jin-Fu Li, Chao-Da Huang:
An Efficient Diagnosis Scheme for Random Access Memories. 277-282 - Said Hamdioui, John Delos Reyes, Zaid Al-Ars:
Evaluation of Intra-Word Faults in Word-Oriented RAMs. 283-288
Session C4: Analog Testing
- Jochen Rivoir:
Low-Cost Analog Signal Generation Using a Pulse-Density Modulated Digital ATE Channel. 290-295 - Chih-Haur Huang, Kuen-Jong Lee, Soon-Jyh Chang:
A Low-Cost Diagnosis Methodology for Pipelined A/D Converters. 296-301 - Ganesh Srinivasan, Shalabh Goyal, Abhijit Chatterjee:
Reconfiguration for Enhanced ALternate Test (REALTest) of Analog Circuits. 302-307 - C. C. Su, C. S. Chang, H. W. Huang, D. S. Tu, C. L. Lee, Jerry C. H. Lin:
Dynamic Analog Testing via ATE Digital Test Channels. 308-312
Session A5: Testable Design
- Mike W. T. Wong, Yubin Zhang:
Design and Implementation of Self-Testable Full Range Window Comparator. 314-318 - Jin-Fu Li, Chih-Chiang Hsu:
Efficient Test Methodologies for Conditional Sum Adders. 319-324 - Dilip P. Vasudevan, Parag K. Lala, James Patrick Parkerson:
A Novel Approach for On-line Testable Reversible Logic Circuit Desig. 325-330 - Sukanta Das, Biplab K. Sikdar, Parimal Pal Chaudhuri:
Nonlinear CA Based Scalable Design of On-Chip TPG for Multiple Cores. 331-334
Session B5: Testability Analysis
- Guanghui Li, Xiaowei Li:
Circuit-Width Based Heuristic for Boolean Reasoning. 336-341 - Debesh Kumar Das, Tomoo Inoue, Susanta Chakraborty, Hideo Fujiwara:
Max-Testable Class of Sequential Circuits having Combinational Test Generation Complexity. 342-347 - Chia Yee Ooi, Hideo Fujiwara:
Classification of Sequential Circuits Based on ?k Notation. 348-353 - Shiy Xu, E. Edirisuriya:
A New Way of Detecting Reconvergent Fanout Branch Pairs in Logic Circuits. 354-357
Session C5: Yield and Reliability
- Chin-Long Wey, Meng-Yao Liu:
Burn-In Stress Test of Analog CMOS ICs. 360-365 - Rei-Fu Huang, Chin-Lung Su, Cheng-Wen Wu, Shen-Tien Lin, Kun-Lun Luo, Yeong-Jar Chang:
Fail Pattern Identification for Memory Built-In Self-Repair. 366-371 - Haihua Yan, Adit D. Singh:
Reduce Yield Loss in Delay Defect Detection in Slack Interval. 372-377 - Chin-Yu Huang, Chu-Ti Lin, Chuan-Ching Sue:
Considering Fault Dependency and Debugging Time Lag in Reliability Growth Modeling during Software Testing. 378-383
Session A6: Fault Tolerance
- Melvin A. Breuer:
Intelligible Test Techniques to Support Error-Tolerance. 386-393 - Jinmin Yang, Dafang Zhang:
Bounding Rollback-Recovery of Large Distributed Computation in WAN Environment. 394-399 - Chuan-Ching Sue, Jun-Ying Yeh, Chin-Yu Huang:
Full Restoration of Multiple Faults in WDM Networks without Wavelength Conversion. 400-405 - Naotake Kamiura, Teijiro Isokawa, Nobuyuki Matsui:
On Improvement in Fault Tolerance of Hopfield Neural Networks. 406-411
Session B6: FPGA Testing and Test Reduction
- Shyue-Kung Lu, Hung-Chin Wu, Shoei-Jia Yan, Yu-Cheng Tsai:
Testing and Diagnosis Techniques for LUT-Based FPGA's. 414-419 - Donghoon Han, Abhijit Chatterjee:
Device Resizing Based Optimization of Analog Circuits for Reduced Test Cost: Cost Metric and Case Study. 420-425 - Hideyuki Ichihara, Masakuni Ochi, Michihiro Shintani, Tomoo Inoue:
A Test Decompression Scheme for Variable-Length Coding. 426-431 - Youhua Shi, Shinji Kimura, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki:
Alternative Run-Length Coding through Scan Chain Reconfiguration for Joint Minimization of Test Data Volume and Power Consumption in Scan Test. 432-437
Session C6: Delay Testing
- Lei Wang, Sandeep K. Gupta, Melvin A. Breuer:
Modeling and Simulation for Crosstalk Aggravated by Weak-Bridge Defects between On-Chip Interconnects. 440-447 - Irith Pomeranz, Sudhakar M. Reddy:
A Postprocessing Procedure of Test Enrichment for Path Delay Faults. 448-453 - Ho Fai Ko, Nicola Nicolici:
Functional Scan Chain Design at RTL for Skewed-Load Delay Fault Testing. 454-459 - Antonio Zenteno, Víctor H. Champac, Michel Renovell, Florence Azaïs:
Analysis and Attenuation Proposal in Ground Bounce. 460-463
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