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ORCID18th ECCV Workshops 2024: Milan, Italy - Part IV
- Alessio Del Bue, Cristian Canton, Jordi Pont-Tuset, Tatiana Tommasi:
Computer Vision - ECCV 2024 Workshops - Milan, Italy, September 29-October 4, 2024, Proceedings, Part IV. Lecture Notes in Computer Science 15626, Springer 2025, ISBN 978-3-031-92804-8 - Vivek Chavan
, Oliver Heimann, Jörg Krüger:
On the Application of Egocentric Computer Vision to Industrial Inspection. 1-17 - Youcef Djenouri, Ahmed Nabil Belbachir, Asma Belhadi, Tomasz P. Michalak:
Neurosymbolic Visual Transform Based on Logic Tensor Network for Defect Detection. 18-34 - Luis Gonzalez-Naharro, Arnoud Jochemsen, Nabil Belbachir, Erik T. Hauge:
Multimodal Computer Vision Techniques for Wooden Utility Pole Density Estimation with Contact-Free Sensing. 35-49 - Emanuele Caruso, Francesco Pelosin, Alessandro Simoni, Marco Boschetti:
Dynamic Label Injection for Imbalanced Industrial Defect Segmentation. 50-64 - Maximilian Andreas Hoefler, Karsten Müller, Wojciech Samek:
XAI-Guided Insulator Anomaly Detection for Imbalanced Datasets. 65-81 - Mert Özer, Maximilian Weiherer, Martin Hundhausen, Bernhard Egger:
Exploring Multi-modal Neural Scene Representations With Applications on Thermal Imaging. 82-98 - Pantelis Menteidis, Christos Papaioannidis, Ioannis Pitas:
Foreground-Aware Knowledge Distillation for Enhanced Damage Detection. 99-115 - Ying Zhao:
AnomalyFactory: Regard Anomaly Generation as Unsupervised Anomaly Localization. 116-132 - Daniel Gramelt, Timon Höfer, Ute Schmid:
Interactive Explainable Anomaly Detection for Industrial Settings. 133-147 - Kecen Li, Bingquan Dai, Jingjing Fu, Xinwen Hou:
DAS3D: Dual-Modality Anomaly Synthesis for 3D Anomaly Detection. 148-165 - Shih-Chih Lin, Shang-Hong Lai:
SQUAD: Scalar Quantized Representation Learning for Unsupervised Anomaly Detection and Localization. 166-182 - Fedor Zolotarev, Tuomas Eerola, Tomi Kauppi:
Deep Unsupervised Segmentation of Log Point Clouds. 183-196 - Zhe Liu, Ying Weng, Yiming Zhang:
A Computer Vision System for Automatic Edge Detection of Magnetic Grain Profile. 197-210 - Dan Lehman, Tim J. Schoonbeek, Shao-Hsuan Hung, Jacek Kustra, Peter H. N. de With, Fons van der Sommen:
Find the Assembly Mistakes: Error Segmentation for Industrial Applications. 211-227 - Bappaditya Dey, Matthias Monden, Víctor Blanco, Sandip Halder, Stefan De Gendt:
Advancing SEM Based Nano-scale Defect Analysis in Semiconductor Manufacturing for Advanced IC Nodes. 228-243 - Riya Sadrani, Ayush Bachan, Hrishikesh Sharma:
On The Relationship Between Visual Anomaly-Free and Anomalous Representations. 244-258 - Flavia Monti, Matteo Marinacci, Francesco Leotta, Massimo Mecella:
DIE-VIS: An Automated Visual Inspection System for Cardboard Box Manufacturing. 259-275 - Keryan Chelouche, Marie Lachaize, Marine Bernard, Louise Olgiati, Rémi Cuingnet:
When the Small-Loss Trick is Not Enough: Multi-label Image Classification with Noisy Labels Applied to CCTV Sewer Inspections. 276-293 - Mykhailo Koshil, Tilman Wegener, Detlef Mentrup, Simone Frintrop, Christian Wilms:
AnomalousPatchCore: Exploring the Use of Anomalous Samples in Industrial Anomaly Detection. 294-309 - Teng Yang, Pengcheng Gao, Jinbao Wang, Yongliang Tang:
Self-supervised Models are Strong Industrial Few-Shot Defect Classification Learners. 310-327 - Arnoud Jochemsen, Hege Indresand, Martin Chamberland, Etienne Drouin, Jan Robert Fiksdal, Xuan Zhang, Nabil Belbachir:
Hyperspectral Imaging and Computer Vision Based Remote Monitoring of SO2 Emissions in Maritime Vessels. 328-341 - Andrea Marelli, Luca Magri, Federica Arrigoni, Giacomo Boracchi:
Temporal-Consistent CAMs for Weakly Supervised Video Segmentation in Waste Sorting. 342-359 - Runzhou Mao, Juraj Fulir, Christoph Garth, Petra Gospodnetic:
Sequential PatchCore: Anomaly Detection for Surface Inspection Using Synthetic Impurities. 360-377 - Yizhe Liu, Yan Song Hu, Yuhao Chen, John S. Zelek:
SplatPose+: Real-Time Image-Based Pose-Agnostic 3D Anomaly Detection. 378-391 - Thao Nguyen Phuong, Vinh Nguyen Duy, Hidetomo Sakaino:
BBD-Polyp: Weakly Supervised Polyp Segmentation via Bounding Box and Depth Map. 392-408 - Christian Benz, Volker Rodehorst:
Enstrect: A Stage-Based Approach to 2.5D Structural Damage Detection. 409-427 - Zheming Zuo, Joseph Smith, Jonathan Stonehouse, Boguslaw Obara:
An Augmentation-Based Model Re-adaptation Framework for Robust Image Segmentation. 428-444 - Muhammad Aqeel, Shakiba Sharifi, Marco Cristani, Francesco Setti:
Meta Learning-Driven Iterative Refinement for Robust Anomaly Detection in Industrial Inspection. 445-460
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