


default search action
23. FTCS 1993: Toulouse, France
- Digest of Papers: FTCS-23, The Twenty-Third Annual International Symposium on Fault-Tolerant Computing, Toulouse, France, June 22-24, 1993. IEEE Computer Society 1993, ISBN 0-8186-3680-7

System Level Fault Tolerance
- Yennun Huang, Chandra M. R. Kintala:

Software Implemented Fault Tolerance Technologies and Experience. FTCS 1993: 2-9 - Mark Russinovich, Zary Segall, Daniel P. Siewiorek:

Application Transparent Fault Management in Fault Tolerant Match. 10-19 - Inhwan Lee, Ravishankar K. Iyer:

Faults, Symptoms, and Software Fault Tolerance in the Tandem GUARDIAN90 Operating System. 20-29 - Deepak Gupta, Pankaj Jalote:

Increasing System Availability through On-Line Software Version Change. 30-35
Dependability Modeling
- Victor F. Nicola, Perwez Shahabuddin, Philip Heidelberger, Peter W. Glynn:

Fast Simulation of Steady-State Availability in Non-Markovian Highly Dependable Systems. 38-47 - Gerardo Rubino, Bruno Sericola:

Interval Availability Distribution Computation. 48-55 - Meera Balakrishnan, Andrew L. Reibman:

Characterizing a Lumping Heuristic for a Markov Network Reliability Model. 56-65 - Chang Chen, Hiroyuki Asada, Yoshiaki Kakuda, Tohru Kikuno:

Comparison of Hybrid Modular Redundant Multiprocessor Systems with respect to Performabilitites. 66-75
Dependability Measurement and Assessment
- Akira Hachiga, Katsuji Akita, Yutaka Hasegawa:

The Design Concepts and Operational Results of Fault-tolerant Computer Systems for the Shinkansen Train Control. 78-87 - Daniel P. Siewiorek, John J. Hudak, Byung-Hoon Suh, Zary Segall:

Development of a Benchmark to Measure System Robustness. 88-97 - Peter G. Bishop:

The Variation of Software Survival Time for Different Operational Input Profiles. 98-107
Error-Control Coding
- Eiji Fujiwara, Masato Kitakami:

A Class of Error Locating Codes for Byte-Organized Memory Systems. 110-119 - Nitin H. Vaidya:

Unidirectional Error Control Codes. 120-129 - Takashi Matsubara, Yoshiaki Koga:

A Proposal for Error-Tolerating Codes. 130-136
Checkpointing and Recovery
- Yi-Min Wang, Yennun Huang, W. Kent Fuchs:

Progressive Retry for Software Error Recovery in Distributed Systems. 138-144 - Lorenzo Alvisi, Bruce Hoppe, Keith Marzullo:

Nonblocking and Orphan-Free Message Logging Protocols. 145-154 - Bob Janssens, W. Kent Fuchs:

Relaxing Consistency in Recoverable Distributed Shared Memory. 155-163
Testing
- Irith Pomeranz, Sudhakar M. Reddy:

EXOP (Extended Operation): A New Logical Fault Model for Digital Circuits. 166-175 - Ronald D. Blanton, John P. Hayes:

Efficient Testing of Tree Circuits. 176-185 - Rolf Krieger, Bernd Becker, R. Sinkovic:

A BDD - based Algorithm for Computation of Exact Fault Detection Probabilities. 186-195
Fault Injection
- Roy A. Maxion, Robert T. Olszewski:

Detection and Discrimination of Injected Network Faults. 198-207 - Harold A. Rosenberg, Kang G. Shin:

Software Fault Injection and its Application in Distributed Systems. 208-217 - Kumar K. Goswami, Ravishankar K. Iyer:

Simulation of Software Behaviour Under Hardware Faults. 218-227 - David Powell, Eliane Martins, Jean Arlat, Yves Crouzet:

Estimators for Fault Tolerance Coverage Evaluation. 228-237
Fault-Tolerant Networks
- Christopher J. Glass, Lionel M. Ni:

Fault-Tolerant Wormhole Routing in Meshes. 240-249 - Kamal Kantawala, Dali L. Tao:

Designing Concurrent Checking Sorting Networks. 250-259 - Jehoshua Bruck, Robert Cypher, Ching-Tien Ho:

Wildcard Dimensions, Coding Theory and Fault-Tolerant Meshes and Hybercubes. 260-267 - Yoshihiro Tohma, Yoichi Koyanagi:

Design of Neural Networks to Tolerate the Mixture of Two Types of Faults. 268-277
Application-Based Fault Tolerance
- Ragini Shamsunder, Daniel J. Rosenkrantz, S. S. Ravi:

Exploiting Data Flow Information in Algorithm-Based Fault Tolerance. 280-289 - Amber Roy-Chowdhury, Prithviraj Banerjee:

Tolerance Determination for Algorithm-Based Checks Using Simplified Error Analysis Techniques. 290-298 - G. Robert Redinbo:

Optimum Detector/Corrector for Fault-Tolerant Linear Processing. 299-308
Simulation and Fault Modeling
- Hungse Cha, Elizabeth M. Rudnick, Gwan S. Choi, Janak H. Patel, Ravishankar K. Iyer:

A Fast and Accurate Gate-Level Transient Fault Simulation Environment. 310-319 - Gwan S. Choi, Ravishankar K. Iyer:

Wear-Out Simulation Environment for VLSI Designs. 320-329 - Irith Pomeranz, Sudhakar M. Reddy, Janak H. Patel:

Theory and Practice of Sequential Machine Testing and Testability. 330-337
Built-in-Self-Test and High-Level Testing
- Yervant Zorian, André Ivanov:

Programmable Space Compaction for BIST. 340-349 - Krishnendu Chakrabarty, John P. Hayes:

Balance Testing of Logic Circuits. 350-359 - Nirmal R. Saxena, Ravi Tangirala, Ajay Srivastava:

Algorithmic Synthesis of High Level Tests for Data Path Designs. 360-369 - Praveen Vishakantaiah, Jacob A. Abraham:

Impact of Behavioral Learning on the Compilation of Sequential Circuit Tests. 370-379
Formal Methods and Distributed Algorithms
- Henning Koch:

An Efficient Replication Protocol Exploiting Logical Tree Structures. 382-391 - Antonio Cau, Willem P. de Roever:

Specifying Fault Tolerance within Stark's Formalism. 392-401 - Patrick Lincoln, John M. Rushby:

A Formally Verified Algorithm for Interactive Consistency Under a Hybrid Fault Model. 402-411 - Piotr Berman, Juan A. Garay:

Randomized Distributed Agreement Revisited. 412-419
Dependability and Performance of Storage Systems
- Mark Holland, Garth A. Gibson, Daniel P. Siewiorek:

Fast, On-Line Failure Recovery in Redundant Disk Arrays. 422-431 - Walter A. Burkhard, Jai Menon:

Disk Array Storage System Reliability. 432-441 - Robert Geist, Kishor S. Trivedi:

An Analytic Treatment of the Reliability and Performance of Mirrored Disk Subsystems. 442-450 - Anupam Bhide, Daniel M. Dias, Nagui Halim, T. Basil Smith, Francis N. Parr:

A Case for Fault-Tolerant Memory for Transaction Processing. 451-460
System Level Diagnosis
- Andrzej Pelc:

Efficient Distributed Diagnosis in the Presence of Random Faults. 462-469 - Richard W. Buskens, Ronald P. Bianchini Jr.:

Distributed On-Line Diagnosis in the Presence of Arbitrary Faults. 470-479 - Jae Young Lee, Hee Yong Youn, Adit D. Singh:

Adaptive Voting for Faulty (VFF) Node Scheme for Distributed Self-Diagnosis. 480-489
Testability and Fault Tolerance Synthesis
- Irith Pomeranz, Sudhakar M. Reddy:

Design and Synthesis for Testability of Synchronous Sequential Circuits Based on Strong-Connectivity. 492-501 - Régis Leveugle, Raphaël Rochet, Gabriele Saucier, L. Martinez, C. Pitot:

A Synthesis Tool for Fault-Tolerant Finite State Machines. 502-511 - Ramesh Karri

, Alex Orailoglu:
Optimal Self-Recovering Microarchitecture Synthesis. 512-521
Fault-Tolerant Distributed Systems
- Hermann Kopetz, Günter Grünsteidl:

TTP - A Time-Triggered Protocol for Fault-Tolerant Real-Time Systems. 524-533 - André Schiper, Aleta Ricciardi:

Virtually-Synchronous Communication Based on a Weak Failure Suspector. 534-543 - Danny Dolev, Shlomo Kramer, Dalia Malki:

Early Delivery Totally Ordered Multicast in Asynchronous Environments. 544-553 - Birgit Baum-Waidner:

Byzantine Agreement with a Minimum Number of Messages Both in the Faultless and Worst Case. 554-563
Concurrent Error Detection and Data Integrity
- Kent D. Wilken, Timothy Kong:

Efficient Memory Access Checking. 566-575 - Robert W. Horst, Doug Jewett, Daniel Lenoski:

The Risk of Data Corruption in Microprocessor-based Systems. 576-585 - Michael Nicolaidis:

Efficient Implementations of Self-Checking Adders and ALUs. 586-595 - Choong Gun Oh, Hee Yong Youn:

On Concurrent Error Detection, Location, and Correction of FFT Networks. 596-605
Panel: Limits in Dependability
- Jean-Claude Laprie, Gérard Le Lann, Michele Morganti, John M. Rushby:

Limits in Dependability (Panel). 608-613
Practical Experience Reports I
- Dominique Brière, Pascal Traverse:

AIRBUS A320/A330/A340 Electrical Flight Controls: A Family of Fault-Tolerant Systems. 616-623 - Claude Hennebert, Gérard D. Guiho:

SACEM: A Fault Tolerant System for Train Speed Control. 624-628
Practical Experience Reports II
- David Chih-Wei Chang, Nirmal R. Saxena:

Concurrent Error Detection/Correction in the HAL MMU Chip. 630-635 - W. David Shambroom:

Use of Protocol Validation and Verification Techniques in the Design of a Fault-Tolerant Computer Architecture. 636-640 - Philippe David, Claude Guidal:

Development of a Fault Tolerant Computer System for the HERMES Space Shuttle. 641-646
Software Demonstrations I
- Michael R. Lyu, Allen P. Nikora, William H. Farr:

A Systematic and Comprehensive Tool for Software Reliability Modeling and Measurement. 648-653 - Karama Kanoun, Mohamed Kaâniche, Jean-Claude Laprie, Sylvain Metge:

SoRel: A Tool for Reliability Growth Analysis and Prediction From Statistical Failure Data. 654-659 - Yves Eychenne, Michel Simatic, Christophe Baradel, Laurent Junot, Bruno Kohen:

The Use of Object Groups to Implement Dependability in a Process Control Supervision System. 660-665
Software Demonstrations II
- C. Béoumes, Karama Kanoun, Martine Aguera, Jean-Claude Laprie, Jean Arlat, Sylvain Metge, S. Bachmann, Jorge Moreira de Souza, C. Bourdeau, David Powell, J.-E. Doucet, P. Spiesser:

SURF-2: A Program for Dependability Evaluation of Complex Hardware and Software Systems. 668-673 - William H. Sanders, W. Douglas Obal II:

Dependability Evaluation Using UltraSAN. 674-679 - Marc Bouissou:

The FIGARO Dependability Evaluation Workbench in Use: Case Studies for Fault-Tolerant Computer Systems. 680-685

manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.


Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCID














