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ORCIDMo Chen 0008
Person information
- affiliation: Space Star Technology Co. Ltd, Beijing, China
- affiliation: University of Saskatchewan, Department of Electrical and Computer Engineering, SK, Canada
Other persons with the same name
- Mo Chen — disambiguation page
- Mo Chen 0001
![[0000-0001-8506-3665]](https://dblp.dagstuhl.de/img/orcid-mark.12x12.png "0000-0001-8506-3665")
— Simon Fraser University (SFU), School of Computing Science, Burnaby, BC, Canada (and 2 more) - Mo Chen 0002 — Changzhou University, School of Microelectronics and Control Engineering, China
- Mo Chen 0003 — Technical University of Munich, School of Computation, Information and Technology, Germany (and 1 more)
- Mo Chen 0004 — Chongqing Normal University, National Center for Applied Mathematics in Chongqing, China (and 1 more)
- Mo Chen 0005 — Binghamton University, Department of Electrical and Computer Engineering, NY, USA (and 3 more)
- Mo Chen 0006 — Imperial College London, Department of Electrical and Electronic Engineering, Communication and Signal Processing, UK
- Mo Chen 0007 — University of South Carolina Aiken, Aiken, SC, USA (and 1 more)
- Mo Chen 0009 — Northeastern University, School of Computer Science and Engineering, Shenyang, China
- Mo Chen 0010 — Nanjing University of Technology (Nanjing Tech University), College of Art and Design, China (and 1 more)
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2020 – today
- 2021
[j6]Shuting Shi, Rui Chen, Rui Liu, Mo Chen, Chen Shen, Xuantian Li, Haonan Tian, Li Chen:
Single Event Upset Evaluation for a 28-nm FDSOI SRAM Type Buffer in an ARM Processor. J. Electron. Test. 37(2): 271-278 (2021)
2010 – 2019
- 2018
- [j5]Yuanqing Li, Li Chen, Issam Nofal, Mo Chen, Haibin Wang, Rui Liu, Qingyu Chen, Milos Krstic, Shuting Shi, Gang Guo, Sang H. Baeg, Shi-Jie Wen, Richard Wong:
Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree. Microelectron. Reliab. 87: 24-32 (2018) - 2017
- [c1]Issam Nofal, Adrian Evans, Anlin He, Gang Guo, Yuanqing Li, Li Chen, Rui Liu, Haibin Wang, Mo Chen, Sang H. Baeg, Shi-Jie Wen, Richard Wong:
BPPT - Bulk potential protection technique for hardened sequentials. IOLTS 2017: 28-32 - 2016
- [j4]Yuanqing Li, Haibin Wang, Lixiang Li, Li Chen, Rui Liu, Mo Chen:
A Built-in Single Event Upsets Detector for Sequential Cells. J. Electron. Test. 32(1): 11-20 (2016) - [j3]Yuanqing Li, Lixiang Li, Yuan Ma, Li Chen, Rui Liu, Haibin Wang, Qiong Wu, Michael Newton, Mo Chen:
A 10-Transistor 65 nm SRAM Cell Tolerant to Single-Event Upsets. J. Electron. Test. 32(2): 137-145 (2016) - [j2]Qingyu Chen, Haibin Wang, Li Chen, Lixiang Li, Xing Zhao, Rui Liu, Mo Chen, Xuantian Li:
An SEU-Resilient SRAM Bitcell in 65-nm CMOS Technology. J. Electron. Test. 32(3): 385-391 (2016) - [j1]Qingyu Chen, Li Chen, Haibin Wang, Longsheng Wu, Yuanqing Li, Xing Zhao, Mo Chen:
Instruction-Vulnerability-Factor-Based Reliability Analysis Model for Program Memory. J. Electron. Test. 32(6): 695-703 (2016)
Coauthor Index
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