<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<inproceedings key="conf/bcicts/IoannouGPR23" mdate="2023-12-01">
<author>Dimitris P. Ioannou</author>
<author>Ephrem G. Gebreselasie</author>
<author>Vinh Pham</author>
<author>Uppili S. Raghunathan</author>
<title>Electrostatic Discharge Stress Effects on the Performance and Reliability of High Performance NPN SiGe HBTs.</title>
<pages>245-248</pages>
<year>2023</year>
<booktitle>BCICTS</booktitle>
<ee>https://doi.org/10.1109/BCICTS54660.2023.10310696</ee>
<crossref>conf/bcicts/2023</crossref>
<url>db/conf/bcicts/bcicts2023.html#IoannouGPR23</url>
</inproceedings>
</dblp>
