BibTeX record conf/irps/WangSCS18

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@inproceedings{DBLP:conf/irps/WangSCS18,
  author       = {Miaomiao Wang and
                  Richard G. Southwick and
                  Kangguo Cheng and
                  James H. Stathis},
  title        = {Lateral profiling of {HCI} induced damage in ultra-scaled FinFET devices
                  with Id-Vd characteristics},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353639},
  doi          = {10.1109/IRPS.2018.8353639},
  timestamp    = {Wed, 28 Jun 2023 16:23:50 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/WangSCS18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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