<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<article key="journals/dt/NatarajanSBCST10" mdate="2020-05-17">
<author>Vishwanath Natarajan</author>
<author>Shreyas Sen</author>
<author>Aritra Banerjee</author>
<author>Abhijit Chatterjee</author>
<author>Ganesh Srinivasan</author>
<author>Friedrich Taenzler</author>
<title>Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems.</title>
<pages>6-17</pages>
<year>2010</year>
<volume>27</volume>
<journal>IEEE Des. Test Comput.</journal>
<number>6</number>
<ee>https://doi.org/10.1109/MDT.2010.123</ee>
<ee>http://doi.ieeecomputersociety.org/10.1109/MDT.2010.123</ee>
<url>db/journals/dt/dt27.html#NatarajanSBCST10</url>
</article></dblp>
