Estimating Process Variability in Radiation-Tolerant Circuits With a New Metric.

Elias de Almeida Ramos Augusto Weber Wilian Padilha João Baptista dos Santos Martins Ricardo Reis 0001 Estimating Process Variability in Radiation-Tolerant Circuits With a New Metric. 2026 June 3849-3860 73 IEEE Trans. Circuits Syst. I Regul. Pap. 6 https://doi.org/10.1109/TCSI.2025.3643158 db/journals/tcasI/tcasI73.html#RamosWPMR26 streams/journals/tcasI