<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<article key="journals/tim/ZhengLWGZX23" mdate="2026-05-19">
<author orcid="0000-0001-6248-3333">Yuting Zheng</author>
<author orcid="0000-0002-1164-7534">Wentao Lyu</author>
<author orcid="0000-0003-3139-9141">Chengqun Wang</author>
<author orcid="0000-0002-1220-3804">Qing Guo 0009</author>
<author orcid="0000-0003-1765-3705">Di Zhou 0009</author>
<author orcid="0000-0002-4206-7022">Weiqiang Xu 0001</author>
<title>Efficient Conflict-Filtered Network for Defect Detection.</title>
<pages>1-14</pages>
<year>2023</year>
<volume>72</volume>
<journal>IEEE Trans. Instrum. Meas.</journal>
<ee>https://doi.org/10.1109/TIM.2023.3293557</ee>
<url>db/journals/tim/tim72.html#ZhengLWGZX23</url>
</article>
</dblp>
