Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node.

Lloyd W. Massengill Yoni Xiong Alexandra Feeley Lloyd W. Massengill Bharat L. Bhuva Shi-Jie Wen Rita Fung Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node. 1-5 2021 IRPS https://doi.org/10.1109/IRPS46558.2021.9405128 conf/irps/2021 db/conf/irps/irps2021.html#XiongFMBWF21 Jingchen Cao Lyuan Xu Shi-Jie Wen Rita Fung Balaji Narasimham Lloyd W. Massengill Bharat L. Bhuva Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm Bulk FinFET Technology. 1-5 2020 IRPS https://doi.org/10.1109/IRPS45951.2020.9129254 conf/irps/2020 db/conf/irps/irps2020.html#CaoXWFNMB20 Jingchen Cao Lyuan Xu Bharat L. Bhuva Shi-Jie Wen Richard Wong Balaji Narasimham Lloyd W. Massengill Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies. 1-5 2019 IRPS https://doi.org/10.1109/IRPS.2019.8720556 conf/irps/2019 db/conf/irps/irps2019.html#CaoXBWWNM19 Lyuan Xu Jingchen Cao Bharat L. Bhuva Indranil Chatterjee Shi-Jie Wen Richard Wong Lloyd W. Massengill Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology. 1-5 2019 IRPS https://doi.org/10.1109/IRPS.2019.8720514 conf/irps/2019 db/conf/irps/irps2019.html#XuCBCWWM19 H. Zhang H. Jiang M. R. Eaker Kurt J. Lezon Balaji Narasimham Nihaar N. Mahatme Lloyd W. Massengill Bharat L. Bhuva Evaluation on flip-flop physical unclonable functions in a 14/16-nm bulk FinFET technology. 1 2018 IRPS https://doi.org/10.1109/IRPS.2018.8353682 conf/irps/2018 db/conf/irps/irps2018.html#ZhangJELNMMB18 Hui Jiang H. Zhang R. C. Harrington J. A. Maharrey J. S. Kauppila Lloyd W. Massengill Bharat L. Bhuva Impact of supply voltage and particle LET on the soft error rate of logic circuits. 4 2018 IRPS https://doi.org/10.1109/IRPS.2018.8353586 conf/irps/2018 db/conf/irps/irps2018.html#JiangZHMKMB18 H. Jiang H. Zhang Balaji Narasimham Lloyd W. Massengill Bharat L. Bhuva Designing soft-error-aware circuits with power and speed optimization. 5-1 2018 IRPS https://doi.org/10.1109/IRPS.2018.8353692 conf/irps/2018 db/conf/irps/irps2018.html#JiangZNMB18 N. Tam Bharat L. Bhuva Lloyd W. Massengill Dennis R. Ball Michael W. McCurdy Michael L. Alles Indranil Chatterjee Multi-cell soft errors at the 16-nm FinFET technology node. 4 2015 IRPS https://doi.org/10.1109/IRPS.2015.7112730 conf/irps/2015 db/conf/irps/irps2015.html#TamBMBMAC15

Nadia Rezzak Michael L. Alles Ronald D. Schrimpf Sarah Kalemeris Lloyd W. Massengill John Sochacki Hugh J. Barnaby The sensitivity of radiation-induced leakage to STI topology and sidewall doping. 889-894 2011 51 Microelectron. Reliab. 5 https://doi.org/10.1016/j.microrel.2010.12.013 db/journals/mr/mr51.html#RezzakASKMSB11

Patrick R. Fleming Brian D. Olson W. Timothy Holman Bharat L. Bhuva Lloyd W. Massengill Design Technique for Mitigation of Soft Errors in Differential Switched-Capacitor Circuits. 838-842 2008 55-II IEEE Trans. Circuits Syst. II Express Briefs 9 https://doi.org/10.1109/TCSII.2008.923437 db/journals/tcas/tcasII55.html#FlemingOHBM08

Lloyd W. Massengill David Bryan Mundie An analog neural hardware implementation using charge-injection multipliers and neutron-specific gain control. 354-362 1992 3 IEEE Trans. Neural Networks 3 https://doi.org/10.1109/72.129408 https://www.wikidata.org/entity/Q80705350 db/journals/tnn/tnn3.html#MassengillM92

Lloyd W. Massengill A dynamic CMOS multiplier for analog VLSI based on exponential pulse-decay modulation. 268-276 1991 March 26 IEEE J. Solid State Circuits 3 https://doi.org/10.1109/4.75005 db/journals/jssc/jssc26.html#Massengill91 streams/journals/jssc

David Bryan Mundie Lloyd W. Massengill Weight decay and resolution effects in feedforward artificial neural networks. 168-170 1991 2 IEEE Trans. Neural Networks 1 https://doi.org/10.1109/72.80308 https://www.wikidata.org/entity/Q47434742 db/journals/tnn/tnn2.html#MundieM91

Lloyd W. Massengill Neal Bengtson RSIM: A circuit simulation program for VLSI interconnect networks. 68-77 1989 52 Simul. 2 https://doi.org/10.1177/003754978905200204 db/journals/simulation/simulation52.html#MassengillB89

Michael L. Alles Dennis R. Ball Hugh J. Barnaby Neal Bengtson Bharat L. Bhuva Jingchen Cao Indranil Chatterjee M. R. Eaker Alexandra Feeley Patrick R. Fleming Rita Fung R. C. Harrington W. Timothy Holman H. Jiang Hui Jiang Sarah Kalemeris J. S. Kauppila Kurt J. Lezon J. A. Maharrey Nihaar N. Mahatme Michael W. McCurdy David Bryan Mundie Balaji Narasimham Brian D. Olson Nadia Rezzak Ronald D. Schrimpf John Sochacki N. Tam Shi-Jie Wen Richard Wong Yoni Xiong Lyuan Xu H. Zhang