The Concept of Coverage and Its Effect on the Reliability Model of a Repairable System.

Thomas F. Arnold

Thomas F. Arnold The Concept of Coverage and Its Effect on the Reliability Model of a Repairable System. 251-254 1973 22 IEEE Trans. Computers 3 https://doi.org/10.1109/T-C.1973.223703 http://doi.ieeecomputersociety.org/10.1109/T-C.1973.223703 db/journals/tc/tc22.html#Arnold73

Monroe M. Newborn Thomas F. Arnold Universal Modules for Bounded Signal Fan-Out Synchronous Sequential Circuits. 63-79 1972 21 IEEE Trans. Computers 1 https://doi.org/10.1109/T-C.1972.223432 http://doi.ieeecomputersociety.org/10.1109/T-C.1972.223432 db/journals/tc/tc21.html#NewbornA72

Thomas F. Arnold Chung-Jen Tan Monroe M. Newborn Iteratively Realized Sequential Circuits. 54-66 1970 19 IEEE Trans. Computers 1 https://doi.org/10.1109/TC.1970.5008900 http://doi.ieeecomputersociety.org/10.1109/TC.1970.5008900 db/journals/tc/tc19.html#ArnoldTN70

Thomas F. Arnold R70-21 Time and Tape Complexity of Pushdown Automaton Languages. 658-659 1970 19 IEEE Trans. Computers 7 https://doi.org/10.1109/T-C.1970.223008 http://doi.ieeecomputersociety.org/10.1109/T-C.1970.223008 db/journals/tc/tc19.html#Arnold70

Iteratively Realized Sequential Circuits: Further Considerations Thomas F. Arnold Monroe M. Newborn 194-212 conf/focs/FOCS10 1969 SWAT db/conf/focs/focs69.html#ArnoldN69 https://doi.org/10.1109/SWAT.1969.11 https://doi.ieeecomputersociety.org/10.1109/SWAT.1969.11 Iteratively Realized Sequential Circuits Thomas F. Arnold Chung-Jen Tan Monroe M. Newborn 431-448 conf/focs/FOCS9 1968 SWAT db/conf/focs/focs68.html#ArnoldTN68 https://doi.org/10.1109/SWAT.1968.14 https://doi.ieeecomputersociety.org/10.1109/SWAT.1968.14 Monty NewbornMonroe M. Newborn Chung-Jen Tan