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<dblpperson name="Md. M. Islam" pid="134/3370" n="2">
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<author pid="134/3370">Md. M. Islam</author>
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<r><inproceedings key="conf/ifip5-7/IslamV13" mdate="2018-06-26">
<author pid="134/3370">Md. M. Islam</author>
<author pid="60/185">John H. Vande Vate</author>
<title>Surplus Product Donation and Sustainability Strategy: Channels and Challenges for Corporate Product Donations.</title>
<pages>54-61</pages>
<year>2013</year>
<crossref>conf/ifip5-7/2013apms1</crossref>
<booktitle>APMS (1)</booktitle>
<ee type="oa">https://doi.org/10.1007/978-3-642-41266-0_7</ee>
<url>db/conf/ifip5-7/apms2013-1.html#IslamV13</url>
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<r><article key="journals/mr/MisraIHKA05" mdate="2020-02-22">
<author pid="39/1875">E. Misra</author>
<author pid="134/3370">Md. M. Islam</author>
<author pid="18/2180">Mahbub Hasan</author>
<author pid="26/3872">H. C. Kim</author>
<author pid="51/5862">T. L. Alford</author>
<title>Percolative approach for failure time prediction of thin film interconnects under high current stress.</title>
<pages>391-395</pages>
<year>2005</year>
<volume>45</volume>
<journal>Microelectron. Reliab.</journal>
<number>2</number>
<ee>https://doi.org/10.1016/j.microrel.2004.09.009</ee>
<url>db/journals/mr/mr45.html#MisraIHKA05</url>
</article>
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<co c="0"><na f="a/Alford:T=_L=" pid="51/5862">T. L. Alford</na></co>
<co c="0"><na f="h/Hasan:Mahbub" pid="18/2180">Mahbub Hasan</na></co>
<co c="0"><na f="k/Kim:H=_C=" pid="26/3872">H. C. Kim</na></co>
<co c="0"><na f="m/Misra:E=" pid="39/1875">E. Misra</na></co>
<co c="-1"><na f="v/Vate:John_H=_Vande" pid="60/185">John H. Vande Vate</na></co>
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