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BibTeX records: Fumihiko Hayashi
@inproceedings{DBLP:conf/icicdt/LiuHFWF12,
author = {Ziyuan Liu and
Fumihiko Hayashi and
Shinji Fujieda and
Markus Wilde and
Katsuyuki Fukutani},
title = {Reliability driven guideline for {BEOL} Optimization: Protecting {MOS}
stacks from hydrogen-related impurity penetration},
booktitle = {{IEEE} International Conference on {IC} Design {\&} Technology,
{ICICDT} 2012, Austin, TX, USA, May 30 - June 1, 2012},
pages = {1--4},
publisher = {{IEEE}},
year = {2012},
url = {https://doi.org/10.1109/ICICDT.2012.6232838},
doi = {10.1109/ICICDT.2012.6232838},
timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
biburl = {https://dblp.org/rec/conf/icicdt/LiuHFWF12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/jssc/GotoOKOMHSHHSAM92,
author = {Hiroyuki Goto and
Hiroaki Ohkubo and
Kenji Kondou and
Masayoshi Ohkawa and
Hitoshi Mitani and
Shinichi Horiba and
Masakazu Soeda and
Fumihiko Hayashi and
Yutaro Hachiya and
Toshiyuki Shimizu and
Manabu Ando and
Zensuke Matsuda},
title = {A 3.3-V 12-ns 16-Mb {CMOS} {SRAM}},
journal = {{IEEE} J. Solid State Circuits},
volume = {27},
number = {11},
pages = {1490--1496},
year = {1992},
url = {https://doi.org/10.1109/4.165327},
doi = {10.1109/4.165327},
timestamp = {Mon, 03 Feb 2025 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/jssc/GotoOKOMHSHHSAM92.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}

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