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BibTeX records: Ira Leventhal
@inproceedings{DBLP:conf/vts/BrownLGS24,
author = {Duane Brown and
Ira Leventhal and
Sri Ganta and
Keith Schaub},
title = {Innovative Practices Track: Session 6 - Using {AI} to Address the
Silicon Growth Curve},
booktitle = {42nd {IEEE} {VLSI} Test Symposium, {VTS} 2024, Tempe, AZ, USA, April
22-24, 2024},
pages = {1},
publisher = {{IEEE}},
year = {2024},
url = {https://doi.org/10.1109/VTS60656.2024.10538627},
doi = {10.1109/VTS60656.2024.10538627},
timestamp = {Mon, 03 Jun 2024 16:53:11 +0200},
biburl = {https://dblp.org/rec/conf/vts/BrownLGS24.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Thangamariappan22,
author = {Vijayakumar Thangamariappan and
Nidhi Agrawal and
Jason Kim and
Constantinos Xanthopoulos and
Ken Butler and
Ira Leventhal and
Joe Xiao},
title = {Improvements in Automated {IC} Socket Pin Defect Detection},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {568--572},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00074},
doi = {10.1109/ITC50671.2022.00074},
timestamp = {Thu, 12 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Thangamariappan22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AgrawalYXTXHSL20,
author = {Nidhi Agrawal and
Min{-}Jian Yang and
Constantinos Xanthopoulos and
Vijayakumar Thangamariappan and
Joe Xiao and
Chee{-}Wah Ho and
Keith Schaub and
Ira Leventhal},
title = {Automated Socket Anomaly Detection through Deep Learning},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325269},
doi = {10.1109/ITC44778.2020.9325269},
timestamp = {Mon, 25 Jan 2021 08:44:58 +0100},
biburl = {https://dblp.org/rec/conf/itc/AgrawalYXTXHSL20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IkedaSLMXN19,
author = {Kosuke Ikeda and
Keith Schaub and
Ira Leventhal and
Yiorgos Makris and
Constantinos Xanthopoulos and
Deepika Neethirajan},
title = {Subtle Anomaly Detection of Microscopic Probes using Deep learning
based Image Completion},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--3},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000126},
doi = {10.1109/ITC44170.2019.9000126},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/IkedaSLMXN19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/NeethirajanXSSL19,
author = {Deepika Neethirajan and
Constantinos Xanthopoulos and
Kiruba S. Subramani and
Keith Schaub and
Ira Leventhal and
Yiorgos Makris},
title = {Machine Learning-based Noise Classification and Decomposition in {RF}
Transceivers},
booktitle = {37th {IEEE} {VLSI} Test Symposium, {VTS} 2019, Monterey, CA, USA,
April 23-25, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/VTS.2019.8758674},
doi = {10.1109/VTS.2019.8758674},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/NeethirajanXSSL19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SokarZRMLRGS19,
author = {Ghada Sokar and
Yassin Zakaria and
Asmaa Rabie and
Kareem Madkour and
Ira Leventhal and
Jochen Rivoir and
Xinli Gu and
Haralampos{-}G. D. Stratigopoulos},
title = {{IP} Session on Machine Learning Applications in {IC} Test-Related
Tasks},
booktitle = {37th {IEEE} {VLSI} Test Symposium, {VTS} 2019, Monterey, CA, USA,
April 23-25, 2019},
pages = {1},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/VTS.2019.8758634},
doi = {10.1109/VTS.2019.8758634},
timestamp = {Thu, 27 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/SokarZRMLRGS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}

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