Towards Process Optimization by Leveraging Relationships Between Electrical Wafer Sorting and Complete-Line Statistical Process Control Data.

Daniele Vinciguerra Dmitrii Fomin Anastasiia Doinychko Andres J. Torres Valeria Borodin David Lemoine Agnès Roussy Daniele Pagano Marco Stefano Scroppo Gabriele Tochino Daniele Vinciguerra Towards Process Optimization by Leveraging Relationships Between Electrical Wafer Sorting and Complete-Line Statistical Process Control Data. 1-12 2025 WSC https://doi.org/10.1109/WSC68292.2025.11338957 conf/wsc/2025 db/conf/wsc/wsc2025.html#FominDTBLRPSTV25 Roberto Rosario Corsini Antonio Costa 0001 Giuseppe Oriti Sergio Fichera Daniele Vinciguerra Marco Stefano Scroppo Daniele Pagano Comparing dispatching rules for minimizing the total weighted tardiness in the cleaning-diffusion manufacturing stage. 2481-2486 2024 CASE https://doi.org/10.1109/CASE59546.2024.10711674 conf/case/2024 db/conf/case/case2024.html#Corsini0OFVSP24 Luigi Claudio Viagrande Filippo L. M. Milotta Paola Giuffrè Giuseppe Bruno Daniele Vinciguerra Giovanni Gallo Semisupervised Classification of Anomalies Signatures in Electrical Wafer Sorting (EWS) Maps. 278-285 2020 VISIGRAPP (5: VISAPP) https://doi.org/10.5220/0008914402780285 conf/visapp/2020-2 db/conf/visapp/visapp2020-2.html#ViagrandeMGBVG20 Valeria Borodin Giuseppe Bruno Roberto Rosario Corsini Antonio Costa 0001 Anastasiia Doinychko Sergio Fichera Dmitrii Fomin Giovanni Gallo Paola Giuffrè David Lemoine Filippo L. M. Milotta Giuseppe Oriti Daniele Pagano Agnès Roussy Marco Stefano Scroppo Gabriele Tochino Andres J. Torres Luigi C. ViagrandeLuigi Claudio Viagrande