Abnormal Data Classification Based on SSA-AELSTM.

Donghyun Kim 0005 Dong Hyun Kim 0005 Sungkyunkwan University, Department of Smart Factory Convergence, Suwon, Republic of Korea https://orcid.org/0000-0002-8350-7661 Donghyun Kim DongHyun Kim Dong-Hyun Kim Dong Hyun Kim Donghyun Kim 0001 https://scholar.google.com/citations?user=FkiYhokAAAAJ https://orcid.org/0000-0002-4845-9369 https://www.wikidata.org/entity/Q130908749 Georgia State University, Atlanta, GA, USA Kennesaw State University, Marietta, Department of Computer Science North Carolina Central University, Durham, Department of Mathematics and Physics University of Texas at Dallas, Richardson Hanyang University, Department of Computer Science and Engineering Donghyun Kim 0002 University of Massachusetts, College of Information and Computer Sciences, Amherst, MA, USA Massachusetts Institute of Technology, Cambridge, MA, USA University of Texas at Austin, Department of Mechanical Engineering, TX, USA https://orcid.org/0000-0001-9534-5383 https://www.wikidata.org/entity/Q96206897 Donghyun Kim 0003 Hanwha Systems Co., Ltd., Yongin Research and Development Center, South Korea https://orcid.org/0000-0001-6267-4746 Donghyun Kim 0004 Korea Advanced Institute of Science and Technology (KAIST), Electrical Engineering Department, Daejeon, South Korea https://orcid.org/0000-0003-2738-9549 Donghyun Kim 0006 MIT-IBM Watson AI Lab Boston University, USA https://orcid.org/0000-0002-7132-4454 Donghyun Kim 0007 NAVER Corporation, Seongnam, South Korea Yahoo! Inc, Yahoo Research, Sunnyvale, CA, USA Pohang University of Science and Technology, POSTECH, Korea https://dl.acm.org/profile/99658748702 https://orcid.org/0000-0002-5049-821X https://orcid.org/0000-0003-3900-6015 https://www.wikidata.org/entity/Q130820261 Donghyun Kim 0008 Dong-Hyun Kim 0008 Yonsei University, Department of Electrical and Electronic Engineering, College of Engineering, Seoul, Korea Stanford University, CA, USA https://orcid.org/0000-0002-6717-7770 https://www.wikidata.org/entity/Q89510889 Donghyun Kim 0009 Hanyang University, Department of Electrical Engineering, Ansan, Korea https://orcid.org/0000-0002-6626-3706 Donghyun Kim 0010 Dong Hyun Kim 0010 Yonsei University, Department of Electrical and Electronic Engineering, Seoul, Korea Donghyun Kim 0012 Dong Hyun Kim 0012 NAVER Corp, Seongnam, South Korea https://scholar.google.com/citations?user=EBC8BMAAAAAJ https://www.linkedin.com/in/donghyun-kim-0643a4158 https://github.com/dhkim0225 https://orcid.org/0000-0001-9033-5231 Donghyun Kim 0013 Yonsei University, School of Electrical and Electronic Engineering, Seoul, Korea Cornell University, Ithaca, NY, USA Massachusetts Institute of Technology, MIT, USA https://orcid.org/0000-0003-1960-0527 https://www.wikidata.org/entity/Q91542377 Donghyun Kim 0014 Qualcomm, Inc., San Diego, CA, USA Korea Advanced Institute of Science and Technology, KAIST, School of Electrical and Computer Science, Daejeon, Korea Donghyun Kim 0016 University of Illinois Urbana-Champaign, USA Donghyun Kim 0017 Electronics and Telecommunications Research Institute, Daejeon, Korea https://scholar.google.com/citations?user=2LCfJX0AAAAJ https://orcid.org/0000-0002-1289-0667 Donghyun Kim DongHyun Kim Dong-Hyun Kim Dong Hyun Kim Donghyun Kim 0010 Dong Hyun Kim 0010 Yonsei University, Department of Electrical and Electronic Engineering, Seoul, Korea Dong-Hyun Kim 0011 Dong Hyun Kim 0011 Pusan National University, Department of Information Convergence Engineering, Busan, Korea https://orcid.org/0000-0002-1362-4846 Donghyun Kim 0012 Dong Hyun Kim 0012 NAVER Corp, Seongnam, South Korea https://scholar.google.com/citations?user=EBC8BMAAAAAJ https://www.linkedin.com/in/donghyun-kim-0643a4158 https://github.com/dhkim0225 https://orcid.org/0000-0001-9033-5231 Donghyun Kim 0005 Seokju Oh Jeongdae Kim Jongpil Jeong Abnormal Data Classification Based on SSA-AELSTM. 867-873 2023 ICCSCI https://doi.org/10.1016/j.procs.2023.10.593 conf/iccsci/2023 db/conf/iccsci/iccsci2023.html#0005OKJ23

Donghyun Kim 0005 Byungjun Park Junhyung Moon 0002 Jaeen Lee Jongpil Jeong Design and Performance Analysis for Edge Intelligence-Based F-PMIPv6 Mobility Support for Smart Manufacturing. 9970942:1-9970942:14 2021 2021 Wirel. Commun. Mob. Comput. https://doi.org/10.1155/2021/9970942 db/journals/wicomm/wicomm2021.html#KimPMLJ21

Donghyun Kim 0005 Jaegyeong Cha Seokju Oh Jongpil Jeong AnoGAN-Based Anomaly Filtering for Intelligent Edge Device in Smart Factory. 1-6 2021 IMCOM https://doi.org/10.1109/IMCOM51814.2021.9377409 conf/icuimc/2021 db/conf/icuimc/imcom2021.html#KimCOJ21 Jaegyeong Cha Seokju Oh Donghyun Kim 0005 Jongpil Jeong A Defect Detection Model for Imbalanced Wafer Image Data Using CAE and Xception. 28-33 2020 IDSTA https://doi.org/10.1109/IDSTA50958.2020.9264135 conf/idsta/2020 db/conf/idsta/idsta2020.html#ChaOKJ20 Jaegyeong Cha Jongpil Jeong Jeongdae Kim Jaeen Lee Junhyung Moon 0002 Seokju Oh Byungjun Park