BibTeX records: W. Nolting

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@inproceedings{DBLP:conf/irps/CelioSNPNLNKPRJSSLLSY24,
  author       = {K. C. Celio and
                  S. Sen and
                  E. Nisenboim and
                  P. M. Pardy and
                  B. Nguyen and
                  V. Le and
                  W. Nolting and
                  S. Kumar and
                  C. A. Peterson and
                  A. Raveh and
                  K. Johnson and
                  B. Stripe and
                  F. Su and
                  M. Lun and
                  S. Lewis and
                  R. I. Spink and
                  W. Yun},
  title        = {Laboratory X-Ray-Assisted Device Alteration for Fault Isolation and
                  Post-Silicon Debug},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2024, Grapevine,
                  TX, USA, April 14-18, 2024},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2024},
  url          = {https://doi.org/10.1109/IRPS48228.2024.10529312},
  doi          = {10.1109/IRPS48228.2024.10529312},
  timestamp    = {Wed, 29 May 2024 21:52:31 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/CelioSNPNLNKPRJSSLLSY24.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}