Patrik Shah
Shiyan Hu 0001
Patrik Shah
Jiang Hu 0001
Pattern Sensitive Placement Perturbation for Manufacturability.
1002-1006
2010
18
IEEE Trans. Very Large Scale Integr. Syst.
6
https://doi.org/10.1109/TVLSI.2009.2017268
db/journals/tvlsi/tvlsi18.html#HuSH10
Jiang Hu 0001
Shiyan Hu 0001