BibTeX records: Domenico Bonanno

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@inproceedings{DBLP:conf/metroauto/dAmbrosioTGCBRMICP25,
  author       = {Moreno d'Ambrosio and
                  Chiara Tripodi and
                  Francesca Garesc{\`{\i}} and
                  Daniele Cosio and
                  Domenico Bonanno and
                  Francesco Rundo and
                  Angelo Alberto Messina and
                  Antonio Imbruglia and
                  Michele Calabretta and
                  Salvatore Patan{\`{e}}},
  title        = {Investigation into the Aging Mechanisms of a SiC-Based Power {MOSFET}
                  by Thermal and Thermomechanical Analysis},
  booktitle    = {{IEEE} International Workshop on Metrology for Automotive, MetroAutomotive
                  2025, Parma, Italy, June 25-27, 2025},
  pages        = {168--172},
  publisher    = {{IEEE}},
  year         = {2025},
  url          = {https://doi.org/10.1109/MetroAutomotive64646.2025.11119275},
  doi          = {10.1109/METROAUTOMOTIVE64646.2025.11119275},
  timestamp    = {Sun, 07 Dec 2025 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/metroauto/dAmbrosioTGCBRMICP25.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}