W. Robert Daasch

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with coauthor community group 2

> Home > Persons > W. Robert Daasch

Publications

2016
[c30]
- view
  authority control:
- export record
  dblp key:
  - conf/itc/ButlerND16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/ButlerND16
Kenneth M. Butler, Amit Nahar, W. Robert Daasch:
What we know after twelve years developing and deploying test data analytics solutions. ITC 2016: 1-8
[c29]
- view
  authority control:
- export record
  dblp key:
  - conf/vts/SiatkowskiSWSDC16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vts/SiatkowskiSWSDC16
Sebastian Siatkowski, Chuanhe Jay Shan, Li-C. Wang, Nikolas Sumikawa, W. Robert Daasch, John M. Carulli:
Consistency in wafer based outlier screening. VTS 2016: 1-6
2015
[c28]
- view
  authority control:
- export record
  dblp key:
  - conf/itc/SiatkowskiCWSWD15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/SiatkowskiCWSWD15
Sebastian Siatkowski, Chia-Ling Chang, Li-C. Wang, Nikolas Sumikawa, LeRoy Winemberg, W. Robert Daasch:
Generalization of an outlier model into a "global" perspective. ITC 2015: 1-10
2014
[j9]
- view
  authority control:
- export record
  dblp key:
  - journals/tc/ShirleyD14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tc/ShirleyD14
C. Glenn Shirley, W. Robert Daasch:
Copula Models of Correlation: A DRAM Case Study. IEEE Trans. Computers 63(10): 2389-2401 (2014)
[c27]
- view
  authority control:
- export record
  dblp key:
  - conf/itc/ShirleyDNC14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/ShirleyDNC14
C. Glenn Shirley, W. Robert Daasch, Phil Nigh, Zoe Conroy:
Board manufacturing test correlation to IC manufacturing test. ITC 2014: 1-8
2011
[c26]
- view
  authority control:
- export record
  dblp key:
  - conf/itc/GotkhindikarDBCN11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/GotkhindikarDBCN11
Kapil R. Gotkhindikar, W. Robert Daasch, Kenneth M. Butler, John M. Carulli Jr., Amit Nahar:
Die-level adaptive test: Real-time test reordering and elimination. ITC 2011: 1-10
2009
[j8]
- view
  authority control:
- export record
  dblp key:
  - journals/dt/DaaschSN09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/dt/DaaschSN09
W. Robert Daasch, C. Glenn Shirley, Amit Nahar:
Statistics in Semiconductor Test: Going beyond Yield. IEEE Des. Test Comput. 26(5): 64-73 (2009)
[j7]
- view
  authority control:
- export record
  dblp key:
  - journals/dt/ButlerCSND09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/dt/ButlerCSND09
Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch:
Multidimensional Test Escape Rate Modeling. IEEE Des. Test Comput. 26(5): 74-82 (2009)
[c25]
- view
  authority control:
- export record
  dblp key:
  - conf/itc/GudavalliDNH09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/GudavalliDNH09
Rama Gudavalli, W. Robert Daasch, Phil Nigh, Douglas Heaberlin:
Application of non-parametric statistics of the parametric response for defect diagnosis. ITC 2009: 1-10
2005
[c19]
- view
  authority control:
- export record
  dblp key:
  - conf/itc/NaharDS05
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/NaharDS05
Amit Nahar, W. Robert Daasch, Suresh Subramaniam:
Burn-in reduction using principal component analysis. ITC 2005: 10

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.