BibTeX records: J. W. McPherson

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@inproceedings{DBLP:conf/irps/BruntLPGM23,
  author       = {Edward Van Brunt and
                  Daniel J. Lichtenwalner and
                  J. H. Park and
                  Satyaki Ganguly and
                  J. W. McPherson},
  title        = {Lifetime Modeling of the 4H-SiC {MOS} Interface in the {HTRB} Condition
                  Under the Influence of Screw Dislocations},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
                  CA, USA, March 26-30, 2023},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/IRPS48203.2023.10117702},
  doi          = {10.1109/IRPS48203.2023.10117702},
  timestamp    = {Tue, 05 Aug 2025 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/BruntLPGM23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/LandmanCBGWFDBN19,
  author       = {Evelyn Landman and
                  Shai Cohen and
                  Noam Brousard and
                  Raanan Gewirtzman and
                  Inbar Weintrob and
                  Eyal Fayne and
                  Yahel David and
                  Yuval Bonen and
                  Omer Niv and
                  Shai Tzroia and
                  Alex Burlak and
                  J. W. McPherson},
  title        = {Degradation Monitoring - from a Vision to Reality},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720527},
  doi          = {10.1109/IRPS.2019.8720527},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/LandmanCBGWFDBN19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/McPherson18,
  author       = {J. W. McPherson},
  title        = {Brief history of {JEDEC} qualification standards for silicon technology
                  and their applicability(?) to {WBG} semiconductors},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {3},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353556},
  doi          = {10.1109/IRPS.2018.8353556},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/McPherson18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/McPherson15,
  author       = {J. W. McPherson},
  title        = {Understanding the underlying degradation physics for proper time-to-failure
                  distribution selection},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {1},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112798},
  doi          = {10.1109/IRPS.2015.7112798},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/McPherson15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/McPherson12,
  author       = {J. W. McPherson},
  title        = {Time dependent dielectric breakdown physics - Models revisited},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {9-10},
  pages        = {1753--1760},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2012.06.007},
  doi          = {10.1016/J.MICROREL.2012.06.007},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/McPherson12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/cicc/McPherson07,
  author       = {J. W. McPherson},
  title        = {Reliability Trends with Advanced {CMOS} Scaling and The Implications
                  for Design},
  booktitle    = {Proceedings of the {IEEE} 2007 Custom Integrated Circuits Conference,
                  {CICC} 2007, DoubleTree Hotel, San Jose, California, USA, September
                  16-19, 2007},
  pages        = {405--412},
  publisher    = {{IEEE}},
  year         = {2007},
  url          = {https://doi.org/10.1109/CICC.2007.4405763},
  doi          = {10.1109/CICC.2007.4405763},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/cicc/McPherson07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dac/McPherson06,
  author       = {J. W. McPherson},
  editor       = {Ellen Sentovich},
  title        = {Reliability challenges for 45nm and beyond},
  booktitle    = {Proceedings of the 43rd Design Automation Conference, {DAC} 2006,
                  San Francisco, CA, USA, July 24-28, 2006},
  pages        = {176--181},
  publisher    = {{ACM}},
  year         = {2006},
  url          = {https://doi.org/10.1145/1146909.1146959},
  doi          = {10.1145/1146909.1146959},
  timestamp    = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dac/McPherson06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/McPherson04,
  author       = {J. W. McPherson},
  title        = {Mie-Gr{\"{u}}neisen Analysis of the Molecular Bonding States
                  in Silica Which Impact Time-Dependent Dielectric Breakdown},
  journal      = {Microelectron. Reliab.},
  volume       = {44},
  number       = {9-11},
  pages        = {1491--1496},
  year         = {2004},
  url          = {https://doi.org/10.1016/j.microrel.2004.07.045},
  doi          = {10.1016/J.MICROREL.2004.07.045},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/McPherson04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/isqed/McPherson01,
  author       = {J. W. McPherson},
  title        = {Scaling-Induced Reductions in {CMOS} Reliability Margins and the Escalating
                  Need for Increased Design-In Reliability Efforts},
  booktitle    = {2nd International Symposium on Quality of Electronic Design {(ISQED}
                  2001), 26-28 March 2001, San Jose, CA, {USA}},
  pages        = {123--130},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/ISQED.2001.915216},
  doi          = {10.1109/ISQED.2001.915216},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/isqed/McPherson01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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