Opto Field-Effect Transistors for Detecting Quercetin-Cu2+ Complex.

Kuei-Shu Chang-Liao

Pradhana Jati Budhi Laksana Li-Chu Tsai Chang-Cheng Lin Kuei-Shu Chang-Liao Mathew K. Moodley Chii-Dong Chen Opto Field-Effect Transistors for Detecting Quercetin-Cu2+ Complex. 7219 2022 22 Sensors 19 https://doi.org/10.3390/s22197219 db/journals/sensors/sensors22.html#LaksanaTLCMC22

Hsin-Kai Fang Kuei-Shu Chang-Liao Chia-Hsin Cheng Po-Yao Lin Wen-Hsien Huang Chang-Hong Shen Jia-Min Shieh SiO2 tunneling and Si3N4/HfO2 trapping layers formed with low temperature processes on gate-all-around junctionless charge-trapping flash memory devices. 319-322 2018 91 Microelectron. Reliab. https://doi.org/10.1016/j.microrel.2018.02.021 db/journals/mr/mr91.html#FangCCLHSS18

Chan-Ching Lin Kuei-Shu Chang-Liao Tzung-Bin Huang Cheng-Jung Yu Hsueh-Chao Ko A new erase method for scaled NAND flash memory device. 34-38 2017 72 Microelectron. Reliab. https://doi.org/10.1016/j.microrel.2017.03.031 db/journals/mr/mr72.html#LinCHYK17

Yanlin Li Kuei-Shu Chang-Liao Yu-Wei Chang Tse-Jung Huang Chen-Chien Li Zhao-Chen Gu Po-Yen Chen Tzung-Yu Wu Jiayi Huang Fu-Chuan Chu Shih-Han Yi Improved reliability characteristics of Ge MOS devices by capping Hf or Zr on interfacial layer. 136-139 2017 79 Microelectron. Reliab. https://doi.org/10.1016/j.microrel.2017.10.018 db/journals/mr/mr79.html#LiCCHLGCWHCY17

Hao-Chieh Lee Kuei-Shu Chang-Liao Yanlin Li Improved reliability of large-sized a-Si thin-film-transistor by back channel treatment in H2. 2178-2182 2015 55 Microelectron. Reliab. 11 https://doi.org/10.1016/j.microrel.2015.09.001 https://www.wikidata.org/entity/Q56918654 db/journals/mr/mr55.html#LeeCL15

Wei-Fong Chi Kuei-Shu Chang-Liao Shih-Han Yi Chen-Chien Li Yanlin Li Gate leakage current suppression and reliability improvement for ultra-low EOT Ge MOS devices by suitable HfAlO/HfON thickness and sintering temperature. 2183-2187 2015 55 Microelectron. Reliab. 11 https://doi.org/10.1016/j.microrel.2015.08.015 https://www.wikidata.org/entity/Q56918661 db/journals/mr/mr55.html#ChiCYLL15

Chun-Chang Lu Kuei-Shu Chang-Liao Chun-Yuan Lu Shih-Cheng Chang Tien-Ko Wang Fu-Chung Hou Yao-Tung Hsu Tunneling component suppression in charge pumping measurement and reliability study for high-k gated MOSFETs. 2110-2114 2011 51 Microelectron. Reliab. 12 https://doi.org/10.1016/j.microrel.2011.04.021 db/journals/mr/mr51.html#LuCLCWHH11

Chia-Huai Ho Kuei-Shu Chang-Liao Chun-Yuan Lu Chun-Chang Lu Tien-Ko Wang Employing vertical dielectric layers to improve the operation performance of flash memory devices. 371-376 2009 49 Microelectron. Reliab. 4 https://doi.org/10.1016/j.microrel.2008.12.004 db/journals/mr/mr49.html#HoCLLW09

Chia-Huai Ho Kuei-Shu Chang-Liao Ya-Nan Huang Tien-Ko Wang T. C. Lu Performance and reliability improvement of flash device by a novel programming method. 967-971 2007 47 Microelectron. Reliab. 6 https://doi.org/10.1016/j.microrel.2006.06.003 db/journals/mr/mr47.html#HoCHWL07

Shih-Cheng Chang Yu-Wei Chang Chii-Dong Chen Po-Yen Chen Chia-Hsin Cheng Wei-Fong Chi Fu-Chuan Chu Hsin-Kai Fang Zhao-Chen Gu Chia-Huai Ho Fu-Chung Hou Yao-Tung Hsu Jiayi Huang Tse-Jung Huang Tzung-Bin Huang Wen-Hsien Huang Ya-Nan Huang Hsueh-Chao Ko Pradhana Jati Budhi Laksana Hao-Chieh Lee Chen-Chien Li Yanlin Li Chan-Ching Lin Chang-Cheng Lin Po-Yao Lin Chun-Chang Lu Chun-Yuan Lu T. C. Lu Mathew K. Moodley Chang-Hong Shen Jia-Min Shieh Li-Chu Tsai Tien-Ko Wang Tzung-Yu Wu Shih-Han Yi Cheng-Jung Yu