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ORCIDSalvatore Patanè
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2020 – today
- 2025
[c6]Moreno d'Ambrosio
, Chiara Tripodi, Francesca Garescì, Daniele Cosio, Domenico Bonanno, Francesco Rundo, Angelo Alberto Messina, Antonio Imbruglia, Michele Calabretta, Salvatore Patanè:
Investigation into the Aging Mechanisms of a SiC-Based Power MOSFET by Thermal and Thermomechanical Analysis. MetroAutomotive 2025: 168-172- [c5]Giulia Castagnolo, Carmelo Pino, Angelo Alberto Messina, Salvatore Patanè, F. Garesci, M. D'Ambrosio, Sebastiano Battiato, Francesco Rundo:
Distillo Framework: A Novel Knowledge Distillation Platform for Advanced Intelligent Solution Deployment Over Automotive-Grade Devices. MetroAutomotive 2025: 210-215 - 2024
- [c4]Nour El I. Boukortt, Antonio Garcia Loureiro, Salvatore Patanè, Mohamed Trabelsi, Trupti Ranjan Lenka, Ahmad Abushattal:
Rear-Passivation Effect on Thin-Film Perovskite/u-CIGS Tandem Solar Cell Performance. IECON 2024: 1-6 - 2022
- [c3]Nour El I. Boukortt, Alamera Nouran Alquennah, Amal M. AlAmri, Salvatore Patanè, Trupti Ranjan Lenka, Rabin Paul:
Photogeneration losses from interface trap density in Passivated Ultrathin CIGS Solar Cell. IECON 2022: 1-6
2010 – 2019
- 2018
- [j3]Saverio Panarello, Claudia Triolo, F. Garesci, Salvatore Patanè, R. Denaro:
Improving ICs reliability with high speed thermal mapping. Integr. 63: 342-350 (2018) - 2017
- [c2]Saverio Panarello, Claudia Triolo, F. Garesci, Salvatore Patanè, Giuseppina Billè, D. Patti, L. Burian, D. Gazzo, Sandor Petenyi, Calogero Ribellino:
Improving ICs reliability with high speed thermal mapping. SMACD 2017: 1-4 - 2016
- [j2]Alina Caddemi, Emanuele Cardillo, Giuseppe Salvo, Salvatore Patanè:
Microwave effects of UV light exposure of a GaN HEMT: Measurements and model extraction. Microelectron. Reliab. 65: 310-317 (2016) - 2011
- [c1]Anna Calabrese, Andrea Pellegrino, Riccardo Po, Nicola Perin, Alessandra Tacca, Luca Longo, Nadia Camaioni, Francesca Tinti, Siraye E. Debebe, Salvatore Patanè, Alfio Consoli:
Design, Synthesis, Characterization and Use of Random Conjugated Copolymers for Optoelectronic Applications. DoCEIS 2011: 596-603 - 2010
- [j1]Antonio Testa, Salvatore De Caro, Saverio Panarello, Salvatore Patanè, Sebastiano Russo, D. Patti, S. Poma, Romeo Letor:
Reliability of planar, Super-Junction and trench low voltage power MOSFETs. Microelectron. Reliab. 50(9-11): 1789-1795 (2010)
Coauthor Index
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