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BibTeX records: Salvatore Patanè
@inproceedings{DBLP:conf/metroauto/dAmbrosioTGCBRMICP25,
author = {Moreno d'Ambrosio and
Chiara Tripodi and
Francesca Garesc{\`{\i}} and
Daniele Cosio and
Domenico Bonanno and
Francesco Rundo and
Angelo Alberto Messina and
Antonio Imbruglia and
Michele Calabretta and
Salvatore Patan{\`{e}}},
title = {Investigation into the Aging Mechanisms of a SiC-Based Power {MOSFET}
by Thermal and Thermomechanical Analysis},
booktitle = {{IEEE} International Workshop on Metrology for Automotive, MetroAutomotive
2025, Parma, Italy, June 25-27, 2025},
pages = {168--172},
publisher = {{IEEE}},
year = {2025},
url = {https://doi.org/10.1109/MetroAutomotive64646.2025.11119275},
doi = {10.1109/METROAUTOMOTIVE64646.2025.11119275},
timestamp = {Sun, 07 Dec 2025 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/metroauto/dAmbrosioTGCBRMICP25.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/metroauto/CastagnoloPMPGDBR25,
author = {Giulia Castagnolo and
Carmelo Pino and
Angelo Alberto Messina and
Salvatore Patan{\`{e}} and
F. Garesci and
M. D'Ambrosio and
Sebastiano Battiato and
Francesco Rundo},
title = {Distillo Framework: {A} Novel Knowledge Distillation Platform for
Advanced Intelligent Solution Deployment Over Automotive-Grade Devices},
booktitle = {{IEEE} International Workshop on Metrology for Automotive, MetroAutomotive
2025, Parma, Italy, June 25-27, 2025},
pages = {210--215},
publisher = {{IEEE}},
year = {2025},
url = {https://doi.org/10.1109/MetroAutomotive64646.2025.11119259},
doi = {10.1109/METROAUTOMOTIVE64646.2025.11119259},
timestamp = {Sat, 06 Sep 2025 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/metroauto/CastagnoloPMPGDBR25.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iecon/BoukorttLPTLA24,
author = {Nour El I. Boukortt and
Antonio Garcia Loureiro and
Salvatore Patan{\`{e}} and
Mohamed Trabelsi and
Trupti Ranjan Lenka and
Ahmad Abushattal},
title = {Rear-Passivation Effect on Thin-Film Perovskite/u-CIGS Tandem Solar
Cell Performance},
booktitle = {50th Annual Conference of the {IEEE} Industrial Electronics Society,
{IECON} 2024, Chicago, IL, USA, November 3-6, 2024},
pages = {1--6},
publisher = {{IEEE}},
year = {2024},
url = {https://doi.org/10.1109/IECON55916.2024.10905925},
doi = {10.1109/IECON55916.2024.10905925},
timestamp = {Sun, 04 Jan 2026 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/iecon/BoukorttLPTLA24.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/iecon/BoukorttAAPLP22,
author = {Nour El I. Boukortt and
Alamera Nouran Alquennah and
Amal M. AlAmri and
Salvatore Patan{\`{e}} and
Trupti Ranjan Lenka and
Rabin Paul},
title = {Photogeneration losses from interface trap density in Passivated Ultrathin
{CIGS} Solar Cell},
booktitle = {{IECON} 2022 - 48th Annual Conference of the {IEEE} Industrial Electronics
Society, Brussels, Belgium, October 17-20, 2022},
pages = {1--6},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/IECON49645.2022.9968670},
doi = {10.1109/IECON49645.2022.9968670},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/iecon/BoukorttAAPLP22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/integration/PanarelloTGPD18,
author = {Saverio Panarello and
Claudia Triolo and
F. Garesci and
Salvatore Patan{\`{e}} and
R. Denaro},
title = {Improving ICs reliability with high speed thermal mapping},
journal = {Integr.},
volume = {63},
pages = {342--350},
year = {2018},
url = {https://doi.org/10.1016/j.vlsi.2018.01.001},
doi = {10.1016/J.VLSI.2018.01.001},
timestamp = {Wed, 04 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/integration/PanarelloTGPD18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/smacd/PanarelloTGPBPB17,
author = {Saverio Panarello and
Claudia Triolo and
F. Garesci and
Salvatore Patan{\`{e}} and
Giuseppina Bill{\`{e}} and
D. Patti and
L. Burian and
D. Gazzo and
Sandor Petenyi and
Calogero Ribellino},
title = {Improving ICs reliability with high speed thermal mapping},
booktitle = {14th International Conference on Synthesis, Modeling, Analysis and
Simulation Methods and Applications to Circuit Design, {SMACD} 2017,
Giardini Naxos, Italy, June 12-15, 2017},
pages = {1--4},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/SMACD.2017.7981607},
doi = {10.1109/SMACD.2017.7981607},
timestamp = {Thu, 14 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/smacd/PanarelloTGPBPB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CaddemiCSP16,
author = {Alina Caddemi and
Emanuele Cardillo and
Giuseppe Salvo and
Salvatore Patan{\`{e}}},
title = {Microwave effects of {UV} light exposure of a GaN {HEMT:} Measurements
and model extraction},
journal = {Microelectron. Reliab.},
volume = {65},
pages = {310--317},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.08.020},
doi = {10.1016/J.MICROREL.2016.08.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CaddemiCSP16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ifip5-5/CalabresePPPTLCTDPC11,
author = {Anna Calabrese and
Andrea Pellegrino and
Riccardo Po and
Nicola Perin and
Alessandra Tacca and
Luca Longo and
Nadia Camaioni and
Francesca Tinti and
Siraye E. Debebe and
Salvatore Patan{\`{e}} and
Alfio Consoli},
editor = {Luis M. Camarinha{-}Matos},
title = {Design, Synthesis, Characterization and Use of Random Conjugated Copolymers
for Optoelectronic Applications},
booktitle = {Technological Innovation for Sustainability - Second {IFIP} {WG} 5.5/SOCOLNET
Doctoral Conference on Computing, Electrical and Industrial Systems,
DoCEIS 2011, Costa de Caparica, Portugal, February 21-23, 2011. Proceedings},
series = {{IFIP} Advances in Information and Communication Technology},
volume = {349},
pages = {596--603},
publisher = {Springer},
year = {2011},
url = {https://doi.org/10.1007/978-3-642-19170-1\_66},
doi = {10.1007/978-3-642-19170-1\_66},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ifip5-5/CalabresePPPTLCTDPC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TestaCPPRPPL10,
author = {Antonio Testa and
Salvatore De Caro and
Saverio Panarello and
Salvatore Patan{\`{e}} and
Sebastiano Russo and
D. Patti and
S. Poma and
Romeo Letor},
title = {Reliability of planar, Super-Junction and trench low voltage power
MOSFETs},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1789--1795},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.042},
doi = {10.1016/J.MICROREL.2010.07.042},
timestamp = {Fri, 30 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TestaCPPRPPL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}

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