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Younes Boulghassoul

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2000 – 2009

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2007
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Riaz Naseer, Jeff Draper, Younes Boulghassoul, Sandeepan DasGupta, Art Witulski:
Critical charge and set pulse widths for combinational logic in commercial 90nm cmos technology. ACM Great Lakes Symposium on VLSI 2007: 227-230
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Riaz Naseer, Younes Boulghassoul, Jeff Draper, Sandeepan DasGupta, Art Witulski:
Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM. ISCAS 2007: 1879-1882

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