BibTeX records: Nehal Patel

• > Home > Persons > Nehal Patel

@inproceedings{DBLP:conf/itc/DuPCCT25,
  author       = {Bin Du and
                  Nehal Patel and
                  Yerong Chen and
                  Jeremy Chin and
                  Katherine Tian},
  title        = {Scan Strategies for High Quality Latch Array Testing},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2025, San Diego, CA, USA,
                  September 20-26, 2025},
  pages        = {414--417},
  publisher    = {{IEEE}},
  year         = {2025},
  url          = {https://doi.org/10.1109/ITC58126.2025.00053},
  doi          = {10.1109/ITC58126.2025.00053},
  timestamp    = {Mon, 22 Dec 2025 17:04:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/DuPCCT25.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/MajumdarSPSDC11,
  author       = {Amitava Majumdar and
                  Arani Sinha and
                  Nehal Patel and
                  Ramamurthy Setty and
                  Yan Dong and
                  Shu{-}Hsuan Chou},
  title        = {A Novel mechanism for speed characterization during delay test},
  booktitle    = {29th {IEEE} {VLSI} Test Symposium, {VTS} 2011, May 1-5, 2011, Dana
                  Point, California, {USA}},
  pages        = {116--121},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/VTS.2011.5783770},
  doi          = {10.1109/VTS.2011.5783770},
  timestamp    = {Thu, 18 Apr 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/MajumdarSPSDC11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}