<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<inproceedings key="conf/africon/VengeN21" mdate="2021-11-03">
<author>Tapiwa Venge</author>
<author>Cuthbert Nyamupangedengu</author>
<title>A Review of Test Voltages Used in Partial Discharge Measurements.</title>
<pages>1-6</pages>
<year>2021</year>
<booktitle>AFRICON</booktitle>
<ee>https://doi.org/10.1109/AFRICON51333.2021.9570871</ee>
<crossref>conf/africon/2021</crossref>
<url>db/conf/africon/africon2021.html#VengeN21</url>
</inproceedings>
</dblp>
