"Low Cost Delay Testing of Nanometer SoCs Using On-Chip Clocking and Test ..."

Hiroyuki Nakamura et al. (2005)

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DOI: 10.1109/ATS.2005.75

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hiroyuki Nakamura, Akio Shirokane, Yoshihito Nishizaki, Anis Uzzaman, Vivek Chickermane, Brion L. Keller, Tsutomu Ube, Yoshihiko Terauchi:
Low Cost Delay Testing of Nanometer SoCs Using On-Chip Clocking and Test Compression. Asian Test Symposium 2005: 156-161

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