"On Using Implied Values in EDT-based Test Compression."

Marcin Gebala et al. (2014)

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DOI: 10.1145/2593069.2593173

access: closed

type: Conference or Workshop Paper

metadata version: 2025-05-01

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Marcin Gebala, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer:
On Using Implied Values in EDT-based Test Compression. DAC 2014: 11:1-11:6

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