Pattern Selection for Testing of Deep Sub-Micron Timing Defects.

Mango Chia-Tso Chao Li-C. Wang Kwang-Ting Cheng Pattern Selection for Testing of Deep Sub-Micron Timing Defects. 160 2004 conf/date/2004 DATE https://doi.org/10.1109/DATE.2004.1269033 https://doi.ieeecomputersociety.org/10.1109/DATE.2004.1269033 http://dl.acm.org/citation.cfm?id=969190 db/conf/date/date2004-2.html#MangoCWC04