<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<inproceedings key="conf/icaiic/BhonsawanwongPS25" mdate="2025-07-11">
<author>Manida Bhonsawanwong</author>
<author>Akarima Pengubon</author>
<author>Noboru Sonehara</author>
<author>Akihisa Kodate</author>
<author>Masamichi Nakamura</author>
<author>Kazuto Kojima</author>
<author>Nagul Cooharojananone</author>
<title>Comparison of Deep Learning Models for Singlsyn Defect Detection and Classification.</title>
<pages>264-269</pages>
<year>2025</year>
<booktitle>ICAIIC</booktitle>
<ee>https://doi.org/10.1109/ICAIIC64266.2025.10920746</ee>
<crossref>conf/icaiic/2025</crossref>
<url>db/conf/icaiic/icaiic2025.html#BhonsawanwongPS25</url>
</inproceedings>
</dblp>
