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"Fast CV MSM Technique for Comprehensive Analysis of Bulk Trapping in Low-K ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Tadeu Mota Frutuoso et al. (2025)

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DOI: 10.1109/IRPS48204.2025.10983765

access: closed

type: Conference or Workshop Paper

metadata version: 2025-06-10

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  - https://dblp.org/rec/conf/irps/FrutuosoVBBLCFD25
Tadeu Mota Frutuoso, William Vandendaele, A. Bond, F. Bringuier, V. Lapras, Marie Claire Cyrille, Claire Fenouillet-Béranger, B. Duriez, Xavier Garros:
Fast CV MSM Technique for Comprehensive Analysis of Bulk Trapping in Low-K Carbon-Doped Dielectrics. IRPS 2025: 1-7

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