Scaling Trends and Bias Dependence of SRAM SER from 16-nm to 3-nm FinFET.

Balaji Narasimham A-R. Montoya C. Paone T. Riehle Mike Smith Liming Tsau Dennis R. Ball Bharat L. Bhuva Scaling Trends and Bias Dependence of SRAM SER from 16-nm to 3-nm FinFET. 10 2024 IRPS https://doi.org/10.1109/IRPS48228.2024.10529467 conf/irps/2024 db/conf/irps/irps2024.html#NarasimhamMPRSTBB24